DOI: 10.7567/ssdm.1994.a-5-5. New Experimental Findings on Stress Induced Leakage Current of Ultra Thin Silicon Dioxides

New Experimental Findings on Stress Induced Leakage Current of Ultra Thin Silicon Dioxides

10.7567/ssdm.1994.a-5-5

Crossref proceedings-article

The Japan Society of Applied Physics

Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials (328)

Bibliography

OKADA, K., KAWASAKI, S., & HIROFUJI, Y. (1994). New Experimental Findings on Stress Induced Leakage Current of Ultra Thin Silicon Dioxides. Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials.

Authors 3

Kenji OKADA (first)
Satoko KAWASAKI (additional)
Yuichi HIROFUJI (additional)

References 0 Referenced 19

None

Dates

Type	When
Created	9 years, 9 months ago (Nov. 6, 2015, 2:19 a.m.)
Deposited	9 years, 9 months ago (Nov. 10, 2015, 11:01 p.m.)
Indexed	2 months ago (June 25, 2025, 7:06 p.m.)
Issued	31 years, 7 months ago (Jan. 1, 1994)
Published	31 years, 7 months ago (Jan. 1, 1994)
Published Print	31 years, 7 months ago (Jan. 1, 1994)

Funders 0

None

BibTeX

@inproceedings{OKADA_1994, series={SSDM1994}, title={New Experimental Findings on Stress Induced Leakage Current of Ultra Thin Silicon Dioxides}, url={http://dx.doi.org/10.7567/ssdm.1994.a-5-5}, DOI={10.7567/ssdm.1994.a-5-5}, booktitle={Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials}, publisher={The Japan Society of Applied Physics}, author={OKADA, Kenji and KAWASAKI, Satoko and HIROFUJI, Yuichi}, year={1994}, collection={SSDM1994} }

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