DOI: 10.4028/www.scientific.net/ddf.194-199.1477. Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements

Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements

10.4028/www.scientific.net/ddf.194-199.1477

Crossref journal-article

Trans Tech Publications, Ltd.

Defect and Diffusion Forum (2457)

Bibliography

Lavoie, C., Cabral, C., dâHeurle, F. M., & Harper, J. M. E. (2001). Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements. Defect and Diffusion Forum, 194â199, 1477â1490.

Authors 4

C. Lavoie (first)
C. Cabral (additional)
François M. d'Heurle (additional)
J.M.E. Harper (additional)

References 0 Referenced 22

None

Dates

Type	When
Created	16 years, 5 months ago (March 16, 2009, 6:49 a.m.)
Deposited	6 months, 1 week ago (Feb. 20, 2025, 4:04 p.m.)
Indexed	6 months, 1 week ago (Feb. 21, 2025, 12:34 a.m.)
Issued	24 years, 4 months ago (April 19, 2001)
Published	24 years, 4 months ago (April 19, 2001)
Published Online	24 years, 4 months ago (April 19, 2001)

Funders 0

None

BibTeX

@article{Lavoie_2001, title={Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements}, volume={194–199}, ISSN={1662-9507}, url={http://dx.doi.org/10.4028/www.scientific.net/ddf.194-199.1477}, DOI={10.4028/www.scientific.net/ddf.194-199.1477}, journal={Defect and Diffusion Forum}, publisher={Trans Tech Publications, Ltd.}, author={Lavoie, C. and Cabral, C. and d’Heurle, François M. and Harper, J.M.E.}, year={2001}, month=apr, pages={1477–1490} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        2,
        21
      ]
    ],
    "date-time": "2025-02-21T05:34:18Z",
    "timestamp": 1740116058227,
    "version": "3.37.3"
  },
  "reference-count": 0,
  "publisher": "Trans Tech Publications, Ltd.",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2001,
            4,
            19
          ]
        ],
        "date-time": "2001-04-19T00:00:00Z",
        "timestamp": 987638400000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://www.scientific.net/PolicyAndEthics/PublishingPolicies"
    },
    {
      "start": {
        "date-parts": [
          [
            2001,
            4,
            19
          ]
        ],
        "date-time": "2001-04-19T00:00:00Z",
        "timestamp": 987638400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.scientific.net/license/TDM_Licenser.pdf"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "DOI": "10.4028/www.scientific.net/ddf.194-199.1477",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2009,
        3,
        16
      ]
    ],
    "date-time": "2009-03-16T10:49:50Z",
    "timestamp": 1237200590000
  },
  "page": "1477-1490",
  "source": "Crossref",
  "is-referenced-by-count": 22,
  "title": "Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements",
  "prefix": "10.4028",
  "volume": "194-199",
  "author": [
    {
      "given": "C.",
      "family": "Lavoie",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Northrop Grumman Electronic Systems"
        }
      ]
    },
    {
      "given": "C.",
      "family": "Cabral",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM Research Division"
        }
      ]
    },
    {
      "given": "Fran\u00e7ois M.",
      "family": "d'Heurle",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM Research Division"
        }
      ]
    },
    {
      "given": "J.M.E.",
      "family": "Harper",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM Research Division"
        }
      ]
    }
  ],
  "member": "2457",
  "published-online": {
    "date-parts": [
      [
        2001,
        4,
        19
      ]
    ]
  },
  "container-title": "Defect and Diffusion Forum",
  "original-title": [],
  "link": [
    {
      "URL": "https://www.scientific.net/DDF.194-199.1477.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2025,
        2,
        20
      ]
    ],
    "date-time": "2025-02-20T21:04:28Z",
    "timestamp": 1740085468000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://www.scientific.net/DDF.194-199.1477"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2001,
        4,
        19
      ]
    ]
  },
  "references-count": 0,
  "URL": "http://dx.doi.org/10.4028/www.scientific.net/DDF.194-199.1477",
  "relation": {},
  "ISSN": [
    "1662-9507"
  ],
  "subject": [],
  "container-title-short": "DDF",
  "published": {
    "date-parts": [
      [
        2001,
        4,
        19
      ]
    ]
  }
}