DOI: 10.3762/bjnano.2.29. The role of the cantilever in Kelvin probe force microscopy measurements

The role of the cantilever in Kelvin probe force microscopy measurements

10.3762/bjnano.2.29

Crossref journal-article

Beilstein Institut

Beilstein Journal of Nanotechnology (2086)

Abstract

The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.

Bibliography

Elias, G., Glatzel, T., Meyer, E., Schwarzman, A., Boag, A., & Rosenwaks, Y. (2011). The role of the cantilever in Kelvin probe force microscopy measurements. Beilstein Journal of Nanotechnology, 2, 252â260. Portico.

Authors 6

George Elias (first)
Thilo Glatzel (additional)
Ernst Meyer (additional)
Alex Schwarzman (additional)
Amir Boag (additional)
Yossi Rosenwaks (additional)

References 21 Referenced 69

10.1116/1.585423
10.1103/PhysRevB.70.085320
10.1007/s100510050219
10.1063/1.368181
10.1007/s003390051138
10.1016/S0169-4332(02)01475-7
10.1063/1.1988089
10.1103/PhysRevB.78.035410
10.1103/PhysRevB.66.035402
10.1116/1.588494
10.1063/1.363884
10.1103/PhysRevB.64.245403
10.1063/1.1384004
10.1103/PhysRevB.74.085413
10.1088/0957-0233/21/2/025502
10.1016/S0169-4332(02)01484-8
10.1088/0957-4484/21/24/245704
{'key': 'ref18', 'volume-title': 'Classical Electrodynamics', 'author': 'Jackson', 'year': '1998', 'edition': '3'} / Classical Electrodynamics by Jackson (1998)
10.1088/0957-4484/20/26/264016
{'key': 'ref21', 'volume-title': 'Tables of characteristic functions representing normal modes of vibration of a beam', 'author': 'Young', 'year': '1949'} / Tables of characteristic functions representing normal modes of vibration of a beam by Young (1949)
{'key': 'ref22', 'volume-title': 'Introduction of Theoretical Mechanics', 'author': 'Becker', 'year': '1954', 'edition': '1'} / Introduction of Theoretical Mechanics by Becker (1954)

Dates

Type	When
Created	14 years, 3 months ago (May 18, 2011, 8:13 a.m.)
Deposited	4 years, 2 months ago (June 25, 2021, 7:32 a.m.)
Indexed	1 year, 1 month ago (July 5, 2024, 1:18 a.m.)
Issued	14 years, 3 months ago (May 18, 2011)
Published	14 years, 3 months ago (May 18, 2011)
Published Online	14 years, 3 months ago (May 18, 2011)

Funders 0

None

BibTeX

@article{Elias_2011, title={The role of the cantilever in Kelvin probe force microscopy measurements}, volume={2}, ISSN={2190-4286}, url={http://dx.doi.org/10.3762/bjnano.2.29}, DOI={10.3762/bjnano.2.29}, journal={Beilstein Journal of Nanotechnology}, publisher={Beilstein Institut}, author={Elias, George and Glatzel, Thilo and Meyer, Ernst and Schwarzman, Alex and Boag, Amir and Rosenwaks, Yossi}, year={2011}, month=may, pages={252–260} }

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