DOI: 10.2138/am.2006.2244. Low-temperature Zr mobility: An in situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in H2O + HCl SiO2 fluids

Low-temperature Zr mobility: An in situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in H2O + HCl SiO2 fluids

10.2138/am.2006.2244

Crossref journal-article

Mineralogical Society of America

American Mineralogist (10602)

Bibliography

Schmidt, C. (2006). Low-temperature Zr mobility: An in situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in H2O + HCl Â SiO2 fluids. American Mineralogist, 91(8â9), 1211â1215.

Authors 1

C. Schmidt (first)

References 0 Referenced 49

None

Dates

Type	When
Created	19 years ago (Aug. 16, 2006, 11:19 a.m.)
Deposited	4 years, 5 months ago (March 4, 2021, 3:30 p.m.)
Indexed	3 months, 3 weeks ago (May 4, 2025, 9:08 p.m.)
Issued	19 years ago (Aug. 1, 2006)
Published	19 years ago (Aug. 1, 2006)
Published Print	19 years ago (Aug. 1, 2006)

Funders 0

None

BibTeX

@article{Schmidt_2006, title={Low-temperature Zr mobility: An in situ synchrotron-radiation XRF study of the effect of radiation damage in zircon on the element release in H2O + HCl SiO2 fluids}, volume={91}, ISSN={0003-004X}, url={http://dx.doi.org/10.2138/am.2006.2244}, DOI={10.2138/am.2006.2244}, number={8–9}, journal={American Mineralogist}, publisher={Mineralogical Society of America}, author={Schmidt, C.}, year={2006}, month=aug, pages={1211–1215} }

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