DOI: 10.2138/am.2005.1743. TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling

TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling

10.2138/am.2005.1743

Crossref journal-article

Mineralogical Society of America

American Mineralogist (10602)

Bibliography

Obst, M. (2005). TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling. American Mineralogist, 90(8â9), 1270â1277.

Authors 1

M. Obst (first)

References 0 Referenced 61

None

Dates

Type	When
Created	20 years ago (Aug. 29, 2005, 10:27 p.m.)
Deposited	4 years, 5 months ago (March 4, 2021, 3:28 p.m.)
Indexed	5 months ago (March 30, 2025, 3:11 a.m.)
Issued	20 years, 1 month ago (Aug. 1, 2005)
Published	20 years, 1 month ago (Aug. 1, 2005)
Published Print	20 years, 1 month ago (Aug. 1, 2005)

Funders 0

None

BibTeX

@article{Obst_2005, title={TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling}, volume={90}, ISSN={0003-004X}, url={http://dx.doi.org/10.2138/am.2005.1743}, DOI={10.2138/am.2005.1743}, number={8–9}, journal={American Mineralogist}, publisher={Mineralogical Society of America}, author={Obst, M.}, year={2005}, month=aug, pages={1270–1277} }

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