DOI: 10.1557/mrs.2014.53. Advances in source technology for focused ion beam instruments

Advances in source technology for focused ion beam instruments

10.1557/mrs.2014.53

Crossref journal-article

Springer Science and Business Media LLC

MRS Bulletin (297)

Abstract

Bibliography

Smith, N. S., Notte, J. A., & Steele, A. V. (2014). Advances in source technology for focused ion beam instruments. MRS Bulletin, 39(4), 329â335.

Authors 3

Noel S. Smith (first)
John A. Notte (additional)
Adam V. Steele (additional)

References 23 Referenced 49

10.1007/978-1-4612-1470-0
10.21236/AD0696987 / Field Ion Microscopy Principles and Applications by Muller (1969)
10.1016/j.phpro.2008.07.088
{'key': 'S0883769414000530_ref20', 'volume-title': 'Principles of Electron Optics, Vol. 2', 'author': 'Hawkes', 'year': '1996'} / Principles of Electron Optics, Vol. 2 by Hawkes (1996)
6. Druce J. , Kyushu University, personal communication.
10.1063/1.3585783
{'key': 'S0883769414000530_ref14', 'first-page': '65', 'volume-title': 'Advances in Imaging and Electron Physics', 'volume': '170', 'author': 'Hill', 'year': '2012'} / Advances in Imaging and Electron Physics by Hill (2012)
{'key': 'S0883769414000530_ref1', 'volume-title': 'Handbook of Charged Particle Optics, 2nd ed', 'author': 'Forbes', 'year': '2009'} / Handbook of Charged Particle Optics, 2nd ed by Forbes (2009)
10.1016/0169-4332(95)00351-7
10.1116/1.3502668
10.1063/1.3605555
10.1063/1.2804287
10.1017/S1551929509000315
10.1017/S1551929512000715
10.1088/1367-2630/13/10/103035
10.1016/j.apsusc.2008.05.141
{'key': 'S0883769414000530_ref8', 'first-page': '7', 'author': 'Tesch', 'year': '2008', 'journal-title': 'Proc. from the 34th International Symposium for Testing and Failure Analysis (ISTFA)'} / Proc. from the 34th International Symposium for Testing and Failure Analysis (ISTFA) by Tesch (2008)
10.1063/1.4816248
10.1002/sca.20239
10.1111/j.1751-908X.2013.00239.x
{'key': 'S0883769414000530_ref7', 'volume-title': 'Proc. of 63rd Electronic Components and Technology Conference, ECTC', 'author': 'Altmann', 'year': '2013'} / Proc. of 63rd Electronic Components and Technology Conference, ECTC by Altmann (2013)
{'key': 'S0883769414000530_ref21', 'volume-title': 'Fundamentals of Statistical and Thermal Physics', 'author': 'Reif', 'year': '2009'} / Fundamentals of Statistical and Thermal Physics by Reif (2009)
10.1116/1.3225588

Dates

Type	When
Created	11 years, 4 months ago (April 9, 2014, 9:53 a.m.)
Deposited	4 years, 5 months ago (Feb. 24, 2021, 4:50 p.m.)
Indexed	3 weeks ago (July 30, 2025, 11:03 a.m.)
Issued	11 years, 4 months ago (April 1, 2014)
Published	11 years, 4 months ago (April 1, 2014)
Published Online	11 years, 4 months ago (April 9, 2014)
Published Print	11 years, 4 months ago (April 1, 2014)

Funders 0

None

BibTeX

@article{Smith_2014, title={Advances in source technology for focused ion beam instruments}, volume={39}, ISSN={1938-1425}, url={http://dx.doi.org/10.1557/mrs.2014.53}, DOI={10.1557/mrs.2014.53}, number={4}, journal={MRS Bulletin}, publisher={Springer Science and Business Media LLC}, author={Smith, Noel S. and Notte, John A. and Steele, Adam V.}, year={2014}, month=apr, pages={329–335} }

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