DOI: 10.1557/s0883769400035144. Ion-Beam Analysis of Polymer Surfaces and Interfaces

Ion-Beam Analysis of Polymer Surfaces and Interfaces

10.1557/s0883769400035144

Crossref journal-article

Springer Science and Business Media LLC

MRS Bulletin (297)

Abstract

Ion-beam analysis of chemical composition as a function of depth is by now well-established for inorganic materials and is an important method of investigating growth of thin films. It has been applied to polymers much more recently, perhaps because fairly obvious problems with radiation damage discouraged workers in this field initially. Ion-beam analysis has developed, however, into a analytical tool that complements other methods, such as x-ray photoelectron spectroscopy and neutron reflection, very well. The purpose of this short article is to give the reader an introduction to its current uses in polymers.The ion beams of ion-beam analysis are typically highly energetic (1–5 MeV) beams of 4He++. While other beams are used, for example, 3He and 15N, alpha particle beams are used in the vast majority of experiments reported in the literature. Two major categories of experiments are carried out with such beams. Rutherford backscattering (RBS) spectrometry to detect heavy elements in the polymer and forward recoil spectrometry (FRES) (also known as elastic recoil detection) to detect the isotopes hydrogen and deuterium. The basic principles for each method are similar.

Bibliography

Kramer, E. J. (1996). Ion-Beam Analysis of Polymer Surfaces and Interfaces. MRS Bulletin, 21(1), 37â42.

Authors 1

Edward J. Kramer (first)

References 66 Referenced 21

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{'key': 'S0883769400035144_ref002', 'volume-title': 'Fundamentals of Surface and Thin Film Analysis', 'author': 'Feldman', 'year': '1986'} / Fundamentals of Surface and Thin Film Analysis by Feldman (1986)
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Dates

Type	When
Created	9 years ago (Aug. 8, 2016, 5:35 a.m.)
Deposited	4 years, 5 months ago (Feb. 24, 2021, 4:19 p.m.)
Indexed	1 year, 1 month ago (June 29, 2024, 6:48 p.m.)
Issued	29 years, 7 months ago (Jan. 1, 1996)
Published	29 years, 7 months ago (Jan. 1, 1996)
Published Online	11 years, 8 months ago (Nov. 29, 2013)
Published Print	29 years, 7 months ago (Jan. 1, 1996)

Funders 0

None

BibTeX

@article{Kramer_1996, title={Ion-Beam Analysis of Polymer Surfaces and Interfaces}, volume={21}, ISSN={1938-1425}, url={http://dx.doi.org/10.1557/s0883769400035144}, DOI={10.1557/s0883769400035144}, number={1}, journal={MRS Bulletin}, publisher={Springer Science and Business Media LLC}, author={Kramer, Edward J.}, year={1996}, month=jan, pages={37–42} }

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