Abstract
ABSTRACTIon implantation of 14N and Rapid Isothermal Annealing (RIA) were employed to achieve n-type doping in epitaxial-grown 6H-SiC layers. The electrical properties of the implanted films were investigated by Hall effect measurements in order to optimize the annealing parameters. In comparison with standard furnace annealing (1470°C/7min), the annealing parameters for the RIA process could be considerably reduced (1050°C/4min). Based on planar technique, implanted p-n junctions were fabricated. The temperature dependence of I-V characteristics and of the quantum efficiency of photodiodes were studied. The maximum of the quantum efficiency at γ=330 nm reaches values of 35% at 400°C.
References
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Dates
Type | When |
---|---|
Created | 14 years, 6 months ago (March 5, 2011, 7:48 p.m.) |
Deposited | 4 years, 6 months ago (Feb. 24, 2021, 2:58 p.m.) |
Indexed | 1 year, 7 months ago (Feb. 3, 2024, 9:48 a.m.) |
Issued | 38 years, 8 months ago (Jan. 1, 1987) |
Published | 38 years, 8 months ago (Jan. 1, 1987) |
Published Online | 14 years, 6 months ago (Feb. 25, 2011) |
Published Print | 38 years, 8 months ago (Jan. 1, 1987) |
@article{Pensl_1987, title={Rapid Isothermal Annealing of N-Implanted 6H-SiC Layers Used for Fabrication of p-n Photodiodes}, volume={97}, ISSN={1946-4274}, url={http://dx.doi.org/10.1557/proc-97-195}, DOI={10.1557/proc-97-195}, journal={MRS Proceedings}, publisher={Springer Science and Business Media LLC}, author={Pensl, Gerhard and Helbig, Reinhard and Zhang, Hong and Ziegler, Gonther and Lanig, Peter}, year={1987} }