Abstract
AbstractFerroelectric thin films typically differ from bulk ceramics in terms of both the average grain size and the degree of stress imposed on the film by the substrate. Studies on bulk ceramics have demonstrated that the number of domain variants within grains depends on the grain size for sizes <˜lμm. This can diminish the poling efficiency of the material. Since most thin films show primary grain sizes well below a micron, similar effects should be observed in films. In addition, since the perovskite ferroelectrics contain ferroelastic as well as ferroelectric domains, it seems clear that stress in thin films may markedly alter the degree to which domain walls contribute to the observed properties. In this paper, the relative importance of these factors are discussed for several types of ferroelectric thin films. Films have been prepared by pulsed laser deposition, magnetron sputtering, and by sol-gel processing. It has been found that epitaxial BaTiO3 films are ferroelectric at 77K down to thicknesses as low as ˜ 60nm. Data on the low and high field electrical properties are reported as a function of temperature, the film crystallinity, and film thickness for representative perovskite films.
References
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Dates
Type | When |
---|---|
Created | 14 years, 4 months ago (April 6, 2011, 7:43 a.m.) |
Deposited | 4 years, 6 months ago (Feb. 24, 2021, 4:14 p.m.) |
Indexed | 11 months, 1 week ago (Sept. 19, 2024, 11:23 a.m.) |
Issued | 29 years, 7 months ago (Jan. 1, 1996) |
Published | 29 years, 7 months ago (Jan. 1, 1996) |
Published Online | 14 years, 6 months ago (Feb. 10, 2011) |
Published Print | 29 years, 7 months ago (Jan. 1, 1996) |
@article{Trolier_Mckinstry_1996, title={Size Effects and Domains in Ferroelectric Thin Film Actuators}, volume={433}, ISSN={1946-4274}, url={http://dx.doi.org/10.1557/proc-433-363}, DOI={10.1557/proc-433-363}, journal={MRS Proceedings}, publisher={Springer Science and Business Media LLC}, author={Trolier-Mckinstry, S. and Randall, C. A. and Maria, J. P. and Theis, C. and Schlom, D. G. and Shepard, J. and Yamakawa, K.}, year={1996} }