DOI: 10.1557/proc-409-45. Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials

Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials

10.1557/proc-409-45

Crossref journal-article

Springer Science and Business Media LLC

MRS Proceedings (297)

Abstract

AbstractA focused ion beam (FIB) system has been applied to prepare a thin foil specimen of Si, MgO and alumina which contained cracks in the plane of foil. It was possible to observe a much larger area at and near a crack tip than has been hitherto possible. FIB was also applied to observation of microstructure near a crack tip evolved during severe rolling contact fatigue in a steel.

Bibliography

Saka, H., Nagaya, G., Sakuishi, T., Abe, S., & Muroga, A. (1995). Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials. MRS Proceedings, 409.

Authors 5

H. Saka (first)
G. Nagaya (additional)
T. Sakuishi (additional)
S. Abe (additional)
A. Muroga (additional)

References 13 Referenced 3

10.1016/0956-716X(95)00108-8
{'key': 'S1946427400260934_ref012', 'first-page': '529', 'volume': '55', 'author': 'Appel', 'year': '1979', 'journal-title': 'Phys.StatSolidi(a)'} / Phys.StatSolidi(a) by Appel (1979)
{'key': 'S1946427400260934_ref008', 'first-page': '271', 'volume-title': 'Specimen Preparation for Transmission Electron Microscopy of Materials, if', 'author': 'Park', 'year': '1990'} / Specimen Preparation for Transmission Electron Microscopy of Materials, if by Park (1990)
10.1111/j.1151-2916.1990.tb05119.x
{'key': 'S1946427400260934_ref001', 'first-page': '205', 'volume-title': 'Dislocations and Properties of Real Materials', 'author': 'Smith', 'year': '1985'} / Dislocations and Properties of Real Materials by Smith (1985)
10.1080/14786436308207338
[10] Saka H. , Kuroda K. , Hong M.H. , Kamino T. , Yaguchi T. , Tsuboi H. , shitani T. , Koike H. , Shibuya A. , and Adachi Y. ,1994, Proc. 13th International Congress on Electron Microscopy, edited by B Jouffrey and C. Colliex, Vol.1,1009.
10.1016/0036-9748(80)90017-4
10.1098/rspa.1989.0001
{'key': 'S1946427400260934_ref009', 'first-page': '205', 'volume-title': 'Specimen Preparation for Transmission Electron Microscopy of Materials, if', 'author': 'Young', 'year': '1990'} / Specimen Preparation for Transmission Electron Microscopy of Materials, if by Young (1990)
{'key': 'S1946427400260934_ref004', 'volume': '32', 'author': 'Stjohn', 'year': '1975', 'journal-title': 'PhilMag.'} / PhilMag. by Stjohn (1975)
10.1080/01418619408242546
10.1016/0036-9748(86)90382-0

Dates

Type	When
Created	14 years, 4 months ago (April 6, 2011, 4:07 a.m.)
Deposited	4 years, 5 months ago (Feb. 24, 2021, 3:58 p.m.)
Indexed	3 years, 4 months ago (April 5, 2022, 12:14 a.m.)
Issued	30 years, 7 months ago (Jan. 1, 1995)
Published	30 years, 7 months ago (Jan. 1, 1995)
Published Online	14 years, 6 months ago (Feb. 15, 2011)
Published Print	30 years, 7 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Saka_1995, title={Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials}, volume={409}, ISSN={1946-4274}, url={http://dx.doi.org/10.1557/proc-409-45}, DOI={10.1557/proc-409-45}, journal={MRS Proceedings}, publisher={Springer Science and Business Media LLC}, author={Saka, H. and Nagaya, G. and Sakuishi, T. and Abe, S. and Muroga, A.}, year={1995} }

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