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Springer Science and Business Media LLC
MRS Proceedings (297)
Abstract

ABSTRACTTypical fatigue and aging characteristics are reported for thin PZT films prepared using sol-gels. The fatigue process occurs in two steps. There is an initial period, during which the domain matrix of the as formed film is restructured by the cycling and the polarization generally increases, followed by a period in which the polarization decays. The polarization decay may be due, in part, to the formation of dielectric layers at the electrodes. The effects of voltage and temperature on fatigue are reported. Aging is examined as a function of temperature. Measurements of internal bias fields do not support the view that they are the primary cause of aging. Neither fatigue nor aging are temperature sensitive making identification of specific physical processes difficult.

Bibliography

Shepherd, W. H. (1990). Fatigue and Aging in Sol-Gel Derived PZT Thin Films. MRS Proceedings, 200.

Authors 1
  1. W.H. Shepherd (first)
References 12 Referenced 36
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Dates
Type When
Created 14 years, 5 months ago (March 6, 2011, 3:32 a.m.)
Deposited 4 years, 6 months ago (Feb. 24, 2021, 3:34 p.m.)
Indexed 1 year, 1 month ago (July 4, 2024, 8:03 a.m.)
Issued 35 years, 8 months ago (Jan. 1, 1990)
Published 35 years, 8 months ago (Jan. 1, 1990)
Published Online 14 years, 6 months ago (Feb. 16, 2011)
Published Print 35 years, 8 months ago (Jan. 1, 1990)
Funders 0

None

@article{Shepherd_1990, title={Fatigue and Aging in Sol-Gel Derived PZT Thin Films}, volume={200}, ISSN={1946-4274}, url={http://dx.doi.org/10.1557/proc-200-277}, DOI={10.1557/proc-200-277}, journal={MRS Proceedings}, publisher={Springer Science and Business Media LLC}, author={Shepherd, W.H.}, year={1990} }