Crossref journal-article
Springer Science and Business Media LLC
Journal of Materials Research (297)
Abstract

Formation of silicon oxide thin films from spin-coated β-chloroethyl silsesquioxane (β-cesq) on silicon, NaCl, and quartz was induced by 193 nm laser pulses. The silicon oxide deposition is characterized by ir, uv, ellipsometry, and Rutherford backscattering spectrometry. The silicon oxide films obtained by uv irradiation were found to have much less carbon and chlorine as impurities and have a higher refractive index as compared to those obtained by annealing. The photoinduced oxide films were found to be smooth, without laser-induced microrough or periodic structures.

Bibliography

Sharma, J., Berry, D. H., Composto, R. J., & Dai, H.-L. (1999). Ultraviolet laser-induced formation of thin silicon oxide film from the precursor β-chloroethyl silsesquioxane. Journal of Materials Research, 14(3), 990–994.

Authors 4
  1. Jaya Sharma (first)
  2. Donald H. Berry (additional)
  3. Russell J. Composto (additional)
  4. Hai-Lung Dai (additional)
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Dates
Type When
Created 17 years, 5 months ago (March 5, 2008, 9:25 p.m.)
Deposited 4 years, 5 months ago (Feb. 24, 2021, 5:09 p.m.)
Indexed 1 year, 11 months ago (Sept. 3, 2023, 2:43 p.m.)
Issued 26 years, 5 months ago (March 1, 1999)
Published 26 years, 5 months ago (March 1, 1999)
Published Online 14 years, 6 months ago (Jan. 31, 2011)
Published Print 26 years, 5 months ago (March 1, 1999)
Funders 0

None

@article{Sharma_1999, title={Ultraviolet laser-induced formation of thin silicon oxide film from the precursor β-chloroethyl silsesquioxane}, volume={14}, ISSN={2044-5326}, url={http://dx.doi.org/10.1557/jmr.1999.0132}, DOI={10.1557/jmr.1999.0132}, number={3}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Sharma, Jaya and Berry, Donald H. and Composto, Russell J. and Dai, Hai-Lung}, year={1999}, month=mar, pages={990–994} }