DOI: 10.1557/jmr.1993.0237. The yield stress of polycrystalline thin films

The yield stress of polycrystalline thin films

10.1557/jmr.1993.0237

Crossref journal-article

Springer Science and Business Media LLC

Journal of Materials Research (297)

Abstract

In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.

Bibliography

Thompson, C. V. (1993). The yield stress of polycrystalline thin films. Journal of Materials Research, 8(2), 237â238.

Authors 1

C.V. Thompson (first)

References 4 Referenced 205

{'key': 'S0884291400019245_ref003', 'volume': '54', 'author': 'Ereund', 'year': '1987', 'journal-title': 'J. Appl. Mech.'} / J. Appl. Mech. by Ereund (1987)
10.1016/0956-716X(92)90513-E
{'key': 'S0884291400019245_ref002', 'volume': '20A', 'author': 'Nix', 'year': '1989', 'journal-title': 'Metall. Trans.'} / Metall. Trans. by Nix (1989)
10.1557/JMR.1992.2040

Dates

Type	When
Created	17 years, 11 months ago (Sept. 27, 2007, 6:41 a.m.)
Deposited	4 years, 6 months ago (Feb. 24, 2021, 4:46 p.m.)
Indexed	1 week, 2 days ago (Aug. 21, 2025, 1:31 p.m.)
Issued	32 years, 6 months ago (Feb. 1, 1993)
Published	32 years, 6 months ago (Feb. 1, 1993)
Published Online	14 years, 6 months ago (Jan. 31, 2011)
Published Print	32 years, 6 months ago (Feb. 1, 1993)

Funders 0

None

BibTeX

@article{Thompson_1993, title={The yield stress of polycrystalline thin films}, volume={8}, ISSN={2044-5326}, url={http://dx.doi.org/10.1557/jmr.1993.0237}, DOI={10.1557/jmr.1993.0237}, number={2}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Thompson, C.V.}, year={1993}, month=feb, pages={237–238} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        21
      ]
    ],
    "date-time": "2025-08-21T17:31:57Z",
    "timestamp": 1755797517849
  },
  "reference-count": 4,
  "publisher": "Springer Science and Business Media LLC",
  "issue": "2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2011,
            1,
            31
          ]
        ],
        "date-time": "2011-01-31T00:00:00Z",
        "timestamp": 1296432000000
      },
      "content-version": "unspecified",
      "delay-in-days": 6573,
      "URL": "https://www.cambridge.org/core/terms"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1993,
        2
      ]
    ]
  },
  "abstract": "<jats:p>In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.</jats:p>",
  "DOI": "10.1557/jmr.1993.0237",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2007,
        9,
        27
      ]
    ],
    "date-time": "2007-09-27T10:41:41Z",
    "timestamp": 1190889701000
  },
  "page": "237-238",
  "source": "Crossref",
  "is-referenced-by-count": 205,
  "title": "The yield stress of polycrystalline thin films",
  "prefix": "10.1557",
  "volume": "8",
  "author": [
    {
      "given": "C.V.",
      "family": "Thompson",
      "sequence": "first",
      "affiliation": []
    }
  ],
  "member": "297",
  "published-online": {
    "date-parts": [
      [
        2011,
        1,
        31
      ]
    ]
  },
  "reference": [
    {
      "key": "S0884291400019245_ref003",
      "volume": "54",
      "author": "Ereund",
      "year": "1987",
      "journal-title": "J. Appl. Mech."
    },
    {
      "key": "S0884291400019245_ref004",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0956-716X(92)90513-E"
    },
    {
      "key": "S0884291400019245_ref002",
      "volume": "20A",
      "author": "Nix",
      "year": "1989",
      "journal-title": "Metall. Trans."
    },
    {
      "key": "S0884291400019245_ref001",
      "doi-asserted-by": "publisher",
      "DOI": "10.1557/JMR.1992.2040"
    }
  ],
  "container-title": "Journal of Materials Research",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0884291400019245",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2021,
        2,
        24
      ]
    ],
    "date-time": "2021-02-24T21:46:28Z",
    "timestamp": 1614203188000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "http://link.springer.com/10.1557/JMR.1993.0237"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1993,
        2
      ]
    ]
  },
  "references-count": 4,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          1993,
          2
        ]
      ]
    }
  },
  "alternative-id": [
    "S0884291400019245"
  ],
  "URL": "http://dx.doi.org/10.1557/JMR.1993.0237",
  "relation": {},
  "ISSN": [
    "0884-2914",
    "2044-5326"
  ],
  "subject": [],
  "container-title-short": "J. Mater. Res.",
  "published": {
    "date-parts": [
      [
        1993,
        2
      ]
    ]
  }
}