DOI: 10.1557/jmr.1993.0214. Mechanism of MoSi<sub>2</sub> pest during low temperature oxidation

Mechanism of MoSi2 pest during low temperature oxidation

10.1557/jmr.1993.0214

Crossref journal-article

Springer Science and Business Media LLC

Journal of Materials Research (297)

Bibliography

Chou, T. C., & Nieh, T. G. (1993). Mechanism of MoSi2 pest during low temperature oxidation. Journal of Materials Research, 8(1), 214â226.

Authors 2

T.C. Chou (first)
T.G. Nieh (additional)

References 0 Referenced 113

None

Dates

Type	When
Created	17 years, 11 months ago (Sept. 27, 2007, 6:41 a.m.)
Deposited	4 years, 6 months ago (Feb. 24, 2021, 4:46 p.m.)
Indexed	1 month ago (July 25, 2025, 6:17 a.m.)
Issued	32 years, 7 months ago (Jan. 1, 1993)
Published	32 years, 7 months ago (Jan. 1, 1993)
Published Print	32 years, 7 months ago (Jan. 1, 1993)

Funders 0

None

BibTeX

@article{Chou_1993, title={Mechanism of MoSi2 pest during low temperature oxidation}, volume={8}, ISSN={0884-2914}, url={http://dx.doi.org/10.1557/jmr.1993.0214}, DOI={10.1557/jmr.1993.0214}, number={1}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Chou, T.C. and Nieh, T.G.}, year={1993}, month=jan, pages={214–226} }

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