Abstract
The activation energies for self-diffusion of transition metals (Au, Ag, Cu, Ni, Pd, Pt) have been calculated with the Embedded Atom Method (EAM); the results agree well with available experimental data for both mono-vacancy and di-vacancy mechanisms. The EAM was also used to calculate activation energies for vacancy migration near dilute impurities. These energies determine the atomic jump frequencies of the classic “five-frequency formula,” which yields the diffusion rates of impurities by a mono-vacancy mechanism. These calculations were found to agree fairly well with experiment and with Neumann and Hirschwald's “Tm” model.
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Dates
Type | When |
---|---|
Created | 17 years, 10 months ago (Sept. 27, 2007, 5:39 a.m.) |
Deposited | 4 years, 6 months ago (Feb. 24, 2021, 4:42 p.m.) |
Indexed | 1 month ago (July 20, 2025, 6:46 p.m.) |
Issued | 36 years, 6 months ago (Feb. 1, 1989) |
Published | 36 years, 6 months ago (Feb. 1, 1989) |
Published Online | 14 years, 6 months ago (Jan. 31, 2011) |
Published Print | 36 years, 6 months ago (Feb. 1, 1989) |
@article{Adams_1989, title={Self-diffusion and impurity diffusion of fee metals using the five-frequency model and the Embedded Atom Method}, volume={4}, ISSN={2044-5326}, url={http://dx.doi.org/10.1557/jmr.1989.0102}, DOI={10.1557/jmr.1989.0102}, number={1}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Adams, J. B. and Foiles, S. M. and Wolfer, W. G.}, year={1989}, month=feb, pages={102–112} }