DOI: 10.1524/zkri.1931.77.1.84. Refraktometrische Messungen an Kristallen

Refraktometrische Messungen an Kristallen

10.1524/zkri.1931.77.1.84

Crossref journal-article

Walter de Gruyter GmbH

Zeitschrift für Kristallographie - Crystalline Materials (374)

Bibliography

Wulff, P., & Heigl, A. (1931). Refraktometrische Messungen an Kristallen. Zeitschrift FÃ¼r Kristallographie - Crystalline Materials, 77(1â6), 84â121.

Authors 2

Peter Wulff (first)
Alois Heigl (additional)

References 0 Referenced 3

None

Dates

Type	When
Created	11 years, 7 months ago (Jan. 15, 2014, 3:22 p.m.)
Deposited	2 years, 9 months ago (Nov. 8, 2022, 1:56 a.m.)
Indexed	2 years, 1 month ago (July 18, 2023, 8:54 a.m.)
Issued	94 years ago (Sept. 1, 1931)
Published	94 years ago (Sept. 1, 1931)
Published Online	9 years, 11 months ago (Sept. 18, 2015)
Published Print	94 years ago (Sept. 1, 1931)

Funders 0

None

BibTeX

@article{Wulff_1931, title={Refraktometrische Messungen an Kristallen}, volume={77}, ISSN={2194-4946}, url={http://dx.doi.org/10.1524/zkri.1931.77.1.84}, DOI={10.1524/zkri.1931.77.1.84}, number={1–6}, journal={Zeitschrift für Kristallographie - Crystalline Materials}, publisher={Walter de Gruyter GmbH}, author={Wulff, Peter and Heigl, Alois}, year={1931}, month=sep, pages={84–121} }

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