DOI: 10.1380/jsssj.9.190. Surface electromigration of metal-covered semiconductor.

Surface electromigration of metal-covered semiconductor.

10.1380/jsssj.9.190

Crossref journal-article

Surface Science Society Japan

Hyomen Kagaku (299)

Bibliography

YASUNAGA, H. (1988). Surface electromigration of metal-covered semiconductor. Hyomen Kagaku, 9(3), 190â199.

Authors 1

Hitoshi YASUNAGA (first)

References 0 Referenced 1

None

Dates

Type	When
Created	14 years, 2 months ago (June 10, 2011, 5:39 a.m.)
Deposited	4 years, 4 months ago (April 11, 2021, 11:29 p.m.)
Indexed	3 years, 2 months ago (June 15, 2022, 10:13 p.m.)
Issued	37 years, 7 months ago (Jan. 1, 1988)
Published	37 years, 7 months ago (Jan. 1, 1988)
Published Print	37 years, 7 months ago (Jan. 1, 1988)

Funders 0

None

BibTeX

@article{YASUNAGA_1988, title={Surface electromigration of metal-covered semiconductor.}, volume={9}, ISSN={1881-4743}, url={http://dx.doi.org/10.1380/jsssj.9.190}, DOI={10.1380/jsssj.9.190}, number={3}, journal={Hyomen Kagaku}, publisher={Surface Science Society Japan}, author={YASUNAGA, Hitoshi}, year={1988}, pages={190–199} }

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