Abstract
The application of the matrix isolation technique to the study of the sputtering process is reported. Equations are derived which relate the experimentally measured absorbance data to the sputtering yield. These equations are applied to data from the sputtering of Nb metal by 50 keV rare gas ions. Relative sputtering yields obtained in this manner are in good agreement with sputtering yields obtained by weight loss measurements. The potential of the technique for studies of both physical and chemical sputtering and for the determination of oscillator strengths is discussed.
References
16
Referenced
7
10.1007/978-1-4613-4595-4
{'volume-title': 'Ion Bombardment of Solids', 'year': '1968', 'author': 'Carter G.', 'key': 'bibr2-000370274774332849'}
/ Ion Bombardment of Solids by Carter G. (1968)10.1007/978-3-642-46025-8
{'volume-title': 'Fifth American Isotope Separator Conference', 'year': '1972', 'author': 'Green D. W.', 'key': 'bibr4-000370274774332849'}
/ Fifth American Isotope Separator Conference by Green D. W. (1972)10.1063/1.1674816
-
Gruen D. M., Gaudioso S. L., McBeth R. L., and Lerner J., J. Chem. Phys. 60 (1974).
(
10.1063/1.1680811
) 10.1063/1.1678089
10.1063/1.1678944
{'key': 'bibr9-000370274774332849', 'volume-title': 'Progress in Nuclear Techniques and Instrumentation', 'volume': '3', 'author': 'Alvager T.', 'year': '1968'}
/ Progress in Nuclear Techniques and Instrumentation by Alvager T. (1968)10.1063/1.1685342
{'volume-title': 'Quantitative Molecular Spectroscopy and Gas Emissivities', 'year': '1959', 'author': 'Penner S. S.', 'key': 'bibr11-000370274774332849'}
/ Quantitative Molecular Spectroscopy and Gas Emissivities by Penner S. S. (1959){'volume-title': 'Vacuum Deposition of Thin Films', 'year': '1958', 'author': 'Holland L.', 'key': 'bibr12-000370274774332849'}
/ Vacuum Deposition of Thin Films by Holland L. (1958)- Moore C. E., Natl. Bur. Std. (U.S.) Circ. 467 (1952).
- Corliss C. H. and Bozman W. R., Natl. Bur. Std. (U.S.) Monograph 53 (1962).
- The sputtering yields for Nb were obtained by dividing the sputtering yields of Mo (Ref. 16) by 1.6. The factor 1.6 comes from a comparison of Mo vs Nb sputtering yields with 45 ke VKr+ ions shown in Fig. 18 of Ref. 16.
10.1016/0029-554X(61)90026-X
Dates
Type | When |
---|---|
Created | 19 years, 11 months ago (Sept. 30, 2005, 7:29 p.m.) |
Deposited | 5 months, 3 weeks ago (March 10, 2025, 10:31 a.m.) |
Indexed | 5 months, 3 weeks ago (March 11, 2025, 12:19 a.m.) |
Issued | 51 years, 8 months ago (Jan. 1, 1974) |
Published | 51 years, 8 months ago (Jan. 1, 1974) |
Published Online | 51 years, 8 months ago (Jan. 1, 1974) |
Published Print | 51 years, 8 months ago (Jan. 1, 1974) |
@article{Green_1974, title={Sputtering Studies Using the Matrix Isolation Technique}, volume={28}, ISSN={1943-3530}, url={http://dx.doi.org/10.1366/000370274774332849}, DOI={10.1366/000370274774332849}, number={1}, journal={Applied Spectroscopy}, publisher={SAGE Publications}, author={Green, David W. and Gruen, Dieter M. and Schreiner, Felix and Lerner, Jerome L.}, year={1974}, month=jan, pages={34–38} }