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Applied Optics (285)
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Kamimura, S. (1987). Direct measurement of nanometric displacement under an optical microscope. Applied Optics, 26(16), 3425.

Authors 1
  1. Shinji Kamimura (first)
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Dates
Type When
Created 16 years, 5 months ago (March 18, 2009, 10:28 a.m.)
Deposited 1 year, 1 month ago (July 18, 2024, 4:44 p.m.)
Indexed 1 year, 1 month ago (July 18, 2024, 8:13 p.m.)
Issued 38 years ago (Aug. 15, 1987)
Published 38 years ago (Aug. 15, 1987)
Published Online 38 years ago (Aug. 15, 1987)
Published Print 38 years ago (Aug. 15, 1987)
Funders 0

None

@article{Kamimura_1987, title={Direct measurement of nanometric displacement under an optical microscope}, volume={26}, ISSN={1539-4522}, url={http://dx.doi.org/10.1364/ao.26.003425}, DOI={10.1364/ao.26.003425}, number={16}, journal={Applied Optics}, publisher={Optica Publishing Group}, author={Kamimura, Shinji}, year={1987}, month=aug, pages={3425} }