DOI: 10.1364/ao.17.000542. Wavelength-scanning polarization-modulation ellipsometry: some practical considerations

Wavelength-scanning polarization-modulation ellipsometry: some practical considerations

10.1364/ao.17.000542

Crossref journal-article

Optica Publishing Group

Applied Optics (285)

Bibliography

Bermudez, V. M., & Ritz, V. H. (1978). Wavelength-scanning polarization-modulation ellipsometry: some practical considerations. Applied Optics, 17(4), 542.

Authors 2

Victor M. Bermudez (first)
Victor H. Ritz (additional)

References 22 Referenced 70

10.1063/1.1684062 / Rev. Sci. Instrum. by Jasperson (1969)
10.1063/1.1686248 / Rev. Sci. Instrum. by Treu (1973)
10.1063/1.1686532 / Rev. Sci. Instrum. by Treu (1974)
10.1103/PhysRev.188.759 / Phys. Rev. by Jasperson (1969)
10.1016/0039-6028(75)90034-5 / Surf. Sci. by O'Handley (1975)
10.1364/JOSA.64.000639 / J. Opt. Soc. Am. by Aspnes (1974)
10.1364/AO.14.000220 / Appl. Opt. by Aspnes (1975)
10.1364/JOSA.63.000523 / J. Opt. Soc. Am. by O'Handley (1973)
{'key': 'ao-17-4-542-R9', 'first-page': '209', 'volume': '45', 'author': 'Azzam', 'year': '1976', 'journal-title': 'Optik'} / Optik by Azzam (1976)
10.1016/0010-4655(77)90015-7 / Computer Phys. Commun. by Bermudez (1977)
10.1088/0950-7671/43/9/301 / J. Sci. Instrum. by King (1966)
10.1063/1.1134076 / Rev. Sci. Instrum. by Wertheim (1975)
10.1364/JOSA.63.000951 / J. Opt. Soc. Am. by Hunter (1973)
10.1364/AO.8.000206 / Appl. Opt. by Moeller (1969)
10.1364/AO.15.001960 / Appl. Opt. by Cheng (1976)
10.1063/1.1684735 / Rev. Sci. Instrum. by Aspnes (1970)
10.1016/0039-6028(73)90345-2 / Surf. Sci. by Jasperson (1973)
10.1364/JOSA.44.000357 / J. Opt. Soc. Am. by Schulz (1954)
10.1364/JOSA.54.001434 / J. Opt. Soc. Am. by Huebner (1964)
10.1103/PhysRevB.6.4370 / Phys. Rev. B by Johnson (1972)
{'key': 'ao-17-4-542-R21', 'first-page': '768', 'volume': '58', 'author': 'Köster', 'year': '1967', 'journal-title': 'Z. Metallkd.'} / Z. Metallkd. by Köster (1967)
10.1007/BF02055759 / Z. Phys. by Gyulai (1927)

Dates

Type	When
Created	16 years, 9 months ago (Nov. 24, 2008, 10:24 a.m.)
Deposited	1 year, 1 month ago (July 18, 2024, 4:34 p.m.)
Indexed	1 year, 1 month ago (July 18, 2024, 8:11 p.m.)
Issued	47 years, 6 months ago (Feb. 15, 1978)
Published	47 years, 6 months ago (Feb. 15, 1978)
Published Online	47 years, 6 months ago (Feb. 15, 1978)
Published Print	47 years, 6 months ago (Feb. 15, 1978)

Funders 0

None

BibTeX

@article{Bermudez_1978, title={Wavelength-scanning polarization-modulation ellipsometry: some practical considerations}, volume={17}, ISSN={1539-4522}, url={http://dx.doi.org/10.1364/ao.17.000542}, DOI={10.1364/ao.17.000542}, number={4}, journal={Applied Optics}, publisher={Optica Publishing Group}, author={Bermudez, Victor M. and Ritz, Victor H.}, year={1978}, month=feb, pages={542} }

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