Crossref journal-article
Walter de Gruyter GmbH
Pure and Applied Chemistry (374)
Abstract

Abstract

Bibliography

Landau, E. M., Wolf, S. G., Segiv, J., Deutsch, M., Kjaer, K., Als-Nielsen, J., Leiserowitz, L., & Lahav, M. (1989). Design and surface synchrotron X-ray structure analysis of Langmuir films for crystal nucleation. Pure and Applied Chemistry, 61(4), 673–684.

Authors 8
  1. E. M. Landau (first)
  2. S. G. Wolf (additional)
  3. J. Segiv (additional)
  4. M. Deutsch (additional)
  5. K. Kjaer (additional)
  6. J. Als-Nielsen (additional)
  7. L. Leiserowitz (additional)
  8. M. Lahav (additional)
References 0 Referenced 25

None

Dates
Type When
Created 17 years, 9 months ago (Nov. 11, 2007, 10:58 a.m.)
Deposited 3 years, 5 months ago (March 5, 2022, 11:49 a.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 3:04 p.m.)
Issued 36 years, 8 months ago (Jan. 1, 1989)
Published 36 years, 8 months ago (Jan. 1, 1989)
Published Online 16 years, 8 months ago (Jan. 1, 2009)
Published Print 36 years, 8 months ago (Jan. 1, 1989)
Funders 0

None

@article{Landau_1989, title={Design and surface synchrotron X-ray structure analysis of Langmuir films for crystal nucleation}, volume={61}, ISSN={0033-4545}, url={http://dx.doi.org/10.1351/pac198961040673}, DOI={10.1351/pac198961040673}, number={4}, journal={Pure and Applied Chemistry}, publisher={Walter de Gruyter GmbH}, author={Landau, E. M. and Wolf, S. G. and Segiv, J. and Deutsch, M. and Kjaer, K. and Als-Nielsen, J. and Leiserowitz, L. and Lahav, M.}, year={1989}, month=jan, pages={673–684} }