DOI: 10.1201/9781003063056-26. Super resolved microscopy and aberration determination in the TEM.

Super resolved microscopy and aberration determination in the TEM.

10.1201/9781003063056-26

Crossref book-chapter

CRC Press

Electron Microscopy and Analysis 1997 (301)

Bibliography

Kirkland, A. I., Saxton, W. O., & Meyer, R. (2022). Super resolved microscopy and aberration determination in the TEM. Electron Microscopy and Analysis 1997, 105â108.

Authors 3

A I Kirkland (first)
W O Saxton (additional)
R Meyer (additional)

References 0 Referenced 1

None

Dates

Type	When
Created	3 years, 7 months ago (Jan. 5, 2022, 1:08 a.m.)
Deposited	3 years, 7 months ago (Jan. 5, 2022, 1:08 a.m.)
Indexed	11 months, 1 week ago (Sept. 12, 2024, 10:21 a.m.)
Issued	3 years, 7 months ago (Jan. 5, 2022)
Published	3 years, 7 months ago (Jan. 5, 2022)
Published Print	3 years, 7 months ago (Jan. 5, 2022)

Funders 0

None

BibTeX

@inbook{Kirkland_2022, title={Super resolved microscopy and aberration determination in the TEM.}, ISBN={9781003063056}, url={http://dx.doi.org/10.1201/9781003063056-26}, DOI={10.1201/9781003063056-26}, booktitle={Electron Microscopy and Analysis 1997}, publisher={CRC Press}, author={Kirkland, A I and Saxton, W O and Meyer, R}, year={2022}, month=jan, pages={105–108} }

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