DOI: 10.1180/minmag.1996.060.403.01. Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope

Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope

10.1180/minmag.1996.060.403.01

Crossref journal-article

Mineralogical Society

Mineralogical Magazine (7149)

Abstract

AbstractWe have developed a system using ‘forescatter detectors’ for backscattered imaging of specimen surfaces inclined at 50–80° to the incident beam (inclined-scanning) in the SEM. These detectors comprise semiconductor chips placed below the tilted specimen. Forescatter detectors provide an orientation contrast (OC) image to complement quantitative crystallographic data from electron backscatter patterns (EBSP). Specimens were imaged using two detector geometries and these images were compared to those collected with the specimen surface normal to the incident beam (normal-scanning) using conventional backscattered electron detector geometries and also to an automated technique, orientation imaging microscopy (OIM). When normal-scanning, the component of the BSE signal relating to the mean atomic number (z) of the material is an order of magnitude greater than any OC component, making OC imaging in polyphase specimens almost impossible. Images formed in inclined-scanning, using forescatter detectors, have OC and z-contrast signals of similar magnitude, allowing OC imaging in polyphase specimens.OC imaging is purely qualitative, and by repeatedly imaging the same area using different specimen-beam geometries, we found that a single image picks out less than 60% of the total microstructural information and as many as 6 combined images are required to give the full data set. The OIM technique is limited by the EBSP resolution (1–2°) and subsequently misses a lot of microstructural information. The use of forescatter detectors is the most practical means of imaging OC in tilted specimens, but it is also a powerful tool in its own right for imaging microstructures in polyphase specimens, an essential asset for geological work.

Bibliography

Prior, D. J., Trimby, P. W., Weber, U. D., & Dingley, D. J. (1996). Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope. Mineralogical Magazine, 60(403), 859â869.

Authors 4

David J. Prior (first)
Patrick W. Trimby (additional)
Ursula D. Weber (additional)
David J. Dingley (additional)

References 43 Referenced 150

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{'key': 'S0026461X00025007_ref34', 'volume-title': 'Advanced Scanning Electron Microscopy and X-Ray Microanalysis.', 'author': 'Newbury', 'year': '1973'} / Advanced Scanning Electron Microscopy and X-Ray Microanalysis. by Newbury (1973)
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Dates

Type	When
Created	18 years, 8 months ago (Dec. 7, 2006, 1:01 a.m.)
Deposited	4 years, 6 months ago (Feb. 4, 2021, 4:11 p.m.)
Indexed	2 months ago (June 17, 2025, 5:46 a.m.)
Issued	28 years, 8 months ago (Dec. 1, 1996)
Published	28 years, 8 months ago (Dec. 1, 1996)
Published Online	7 years, 1 month ago (July 5, 2018)
Published Print	28 years, 8 months ago (Dec. 1, 1996)

Funders 0

None

BibTeX

@article{Prior_1996, title={Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope}, volume={60}, ISSN={1471-8022}, url={http://dx.doi.org/10.1180/minmag.1996.060.403.01}, DOI={10.1180/minmag.1996.060.403.01}, number={403}, journal={Mineralogical Magazine}, publisher={Mineralogical Society}, author={Prior, David J. and Trimby, Patrick W. and Weber, Ursula D. and Dingley, David J.}, year={1996}, month=dec, pages={859–869} }

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