DOI: 10.1155/tsm.6.45. The Determination of Crystallographic Textures From Selected Areas of a Specimen by Electron Diffraction

The Determination of Crystallographic Textures From Selected Areas of a Specimen by Electron Diffraction

10.1155/tsm.6.45

Crossref journal-article

Wiley

Texture, Stress, and Microstructure (311)

Abstract

A technique for the determination of partial pole figures with an angular resolution of <3°, from selected areas of a thin foil, is described. A microcomputer, interfaced to an unmodified JEOL 100 CX TEMSCAN electron microscope is used to scan a diffraction pattern over a detector, tilt the specimen in steps of 1.5° over a range of ±50°, and plot the resulting data as a semiquantitative pole figure. The application of the technique to the study of materials which deform inhomogeneously is discussed, and examples are given of pole figures obtained from deformed single phase and two phase aluminium specimens.

Bibliography

Humphreys, F. J. (1983). The Determination of Crystallographic Textures From Selected Areas of a Specimen by Electron Diffraction. Texture, Stress, and Microstructure, 6(1), 45â61. Portico.

Authors 1

F. J. Humphreys (first)

References 0 Referenced 25

None

Dates

Type	When
Created	17 years, 3 months ago (April 21, 2008, 5:29 p.m.)
Deposited	1 year ago (Aug. 8, 2024, 5:39 a.m.)
Indexed	1 year ago (Aug. 8, 2024, 6:40 a.m.)
Issued	42 years, 7 months ago (Jan. 1, 1983)
Published	42 years, 7 months ago (Jan. 1, 1983)
Published Online	42 years, 7 months ago (Jan. 1, 1983)
Published Print	42 years, 7 months ago (Jan. 1, 1983)

Funders 0

None

BibTeX

@article{Humphreys_1983, title={The Determination of Crystallographic Textures From Selected Areas of a Specimen by Electron Diffraction}, volume={6}, ISSN={1687-5400}, url={http://dx.doi.org/10.1155/tsm.6.45}, DOI={10.1155/tsm.6.45}, number={1}, journal={Texture, Stress, and Microstructure}, publisher={Wiley}, author={Humphreys, F. J.}, year={1983}, month=jan, pages={45–61} }

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