DOI: 10.1154/s037603080000923x. The Application of X-Ray Diffraction Method to the Measurement of Crystal Deformation and Crystal Modulus of High Polymers

The Application of X-Ray Diffraction Method to the Measurement of Crystal Deformation and Crystal Modulus of High Polymers

10.1154/s037603080000923x

Crossref journal-article

Cambridge University Press (CUP)

Advances in X-ray Analysis (56)

Abstract

AbstractElastic modulus EI of crystalline regions of various high polymers in the direction parallel to the chain axis were measured using an X-ray diffraction method. The crystal deformation can be detected directly by the diffraction peak shift as a function of applied constant stress. The stress in the crystalline regions is assumed to be equal to that applied to the specimen. The validity of this assumption has been proven experimentally for polyethylene, poly(p-phenylene terephthalamide) and so on. The EI values were discussed in relation to molecular conformation and deformation mechanism of the chains.

Bibliography

Nakamae, K., & Nishino, T. (1991). The Application of X-Ray Diffraction Method to the Measurement of Crystal Deformation and Crystal Modulus of High Polymers. Advances in X-Ray Analysis, 35(A), 545â552.

Authors 2

Katsuhiko Nakamae (first)
Takashi Nishino (additional)

References 8 Referenced 4

10.1002/macp.1975.020011975139
{'key': 'S037603080000923X_ref689', 'first-page': '57', 'volume': '31', 'author': 'Sakurada', 'year': '1970', 'journal-title': 'J. Polym. Sci'} / J. Polym. Sci by Sakurada (1970)
Nakamae K. , and Nishino T. , Proc. the 5th Rulduc Polym. Meeting, 1990, The Netherlands.
10.1295/polymj.19.451
{'key': 'S037603080000923X_ref687', 'first-page': '357', 'volume': '265', 'author': 'Peterlin', 'year': '1987', 'journal-title': 'Polym. Sci'} / Polym. Sci by Peterlin (1987)
{'key': 'S037603080000923X_ref688', 'first-page': '75', 'volume': '15', 'author': 'Sakwada', 'year': '1966', 'journal-title': 'J. Polym. Sci'} / J. Polym. Sci by Sakwada (1966)
10.1080/00222349108245780
Nishino T. , Tada K. , and Nakamae K. , Polymer, in press.

Dates

Type	When
Created	6 years, 5 months ago (March 28, 2019, 7:10 a.m.)
Deposited	6 years, 3 months ago (May 18, 2019, 3:29 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 4:49 p.m.)
Issued	34 years, 8 months ago (Jan. 1, 1991)
Published	34 years, 8 months ago (Jan. 1, 1991)
Published Online	6 years, 5 months ago (March 6, 2019)
Published Print	34 years, 8 months ago (Jan. 1, 1991)

Funders 0

None

BibTeX

@article{Nakamae_1991, title={The Application of X-Ray Diffraction Method to the Measurement of Crystal Deformation and Crystal Modulus of High Polymers}, volume={35}, ISSN={2631-3626}, url={http://dx.doi.org/10.1154/s037603080000923x}, DOI={10.1154/s037603080000923x}, number={A}, journal={Advances in X-ray Analysis}, publisher={Cambridge University Press (CUP)}, author={Nakamae, Katsuhiko and Nishino, Takashi}, year={1991}, pages={545–552} }

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