DOI: 10.1149/1.2095751. The Application of Scanning Tunneling Microscopy to In Situ Studies of Nickel Electrodes under Potential Control

The Application of Scanning Tunneling Microscopy to In Situ Studies of Nickel Electrodes under Potential Control

10.1149/1.2095751

Crossref journal-article

The Electrochemical Society

Journal of The Electrochemical Society (77)

Bibliography

Lev, O., Fan, F., & Bard, A. J. (1988). The Application of Scanning Tunneling Microscopy to In Situ Studies of Nickel Electrodes under Potential Control. Journal of The Electrochemical Society, 135(3), 783â784.

Authors 3

Ovadia Lev (first)
Fu‐Ren Fan (additional)
Allen J. Bard (additional)

References 0 Referenced 75

None

Dates

Type	When
Created	19 years, 2 months ago (June 14, 2006, 12:47 p.m.)
Deposited	4 years, 11 months ago (Sept. 7, 2020, 1:20 p.m.)
Indexed	4 months ago (April 17, 2025, 5:03 p.m.)
Issued	37 years, 5 months ago (March 1, 1988)
Published	37 years, 5 months ago (March 1, 1988)
Published Online	5 years, 8 months ago (Dec. 7, 2019)
Published Print	37 years, 5 months ago (March 1, 1988)

Funders 0

None

BibTeX

@article{Lev_1988, title={The Application of Scanning Tunneling Microscopy to In Situ Studies of Nickel Electrodes under Potential Control}, volume={135}, ISSN={1945-7111}, url={http://dx.doi.org/10.1149/1.2095751}, DOI={10.1149/1.2095751}, number={3}, journal={Journal of The Electrochemical Society}, publisher={The Electrochemical Society}, author={Lev, Ovadia and Fan, Fu‐Ren and Bard, Allen J.}, year={1988}, month=mar, pages={783–784} }

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