DOI: 10.1149/1.1837248. The Application of Atomic Force Microscopy for the Study of Li Deposition Processes

The Application of Atomic Force Microscopy for the Study of Li Deposition Processes

10.1149/1.1837248

Crossref journal-article

The Electrochemical Society

Journal of The Electrochemical Society (77)

Bibliography

Aurbach, D., & Cohen, Y. (1996). The Application of Atomic Force Microscopy for the Study of Li Deposition Processes. Journal of The Electrochemical Society, 143(11), 3525â3532.

Authors 2

Doron Aurbach (first)
Yair Cohen (additional)

References 0 Referenced 181

None

Dates

Type	When
Created	19 years, 2 months ago (June 14, 2006, 10:22 a.m.)
Deposited	4 years, 11 months ago (Sept. 7, 2020, 3:05 p.m.)
Indexed	3 weeks, 4 days ago (July 27, 2025, 3:39 a.m.)
Issued	28 years, 9 months ago (Nov. 1, 1996)
Published	28 years, 9 months ago (Nov. 1, 1996)
Published Online	5 years, 8 months ago (Dec. 7, 2019)
Published Print	28 years, 9 months ago (Nov. 1, 1996)

Funders 0

None

BibTeX

@article{Aurbach_1996, title={The Application of Atomic Force Microscopy for the Study of Li Deposition Processes}, volume={143}, ISSN={1945-7111}, url={http://dx.doi.org/10.1149/1.1837248}, DOI={10.1149/1.1837248}, number={11}, journal={Journal of The Electrochemical Society}, publisher={The Electrochemical Society}, author={Aurbach, Doron and Cohen, Yair}, year={1996}, month=nov, pages={3525–3532} }

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