DOI: 10.1147/rd.84.0410. Carrier Surface Scattering in Silicon Inversion Layers

Carrier Surface Scattering in Silicon Inversion Layers

10.1147/rd.84.0410

Crossref journal-article

IBM

IBM Journal of Research and Development (3082)

Bibliography

Fang, F., & Triebwasser, S. (1964). Carrier Surface Scattering in Silicon Inversion Layers. IBM Journal of Research and Development, 8(4), 410â415.

Authors 2

F. Fang (first)
S. Triebwasser (additional)

References 0 Referenced 22

None

Dates

Type	When
Created	15 years, 4 months ago (April 5, 2010, 2:34 p.m.)
Deposited	7 years, 9 months ago (Nov. 14, 2017, 10:32 a.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 1:59 a.m.)
Issued	60 years, 11 months ago (Sept. 1, 1964)
Published	60 years, 11 months ago (Sept. 1, 1964)
Published Print	60 years, 11 months ago (Sept. 1, 1964)

Funders 0

None

BibTeX

@article{Fang_1964, title={Carrier Surface Scattering in Silicon Inversion Layers}, volume={8}, ISSN={0018-8646}, url={http://dx.doi.org/10.1147/rd.84.0410}, DOI={10.1147/rd.84.0410}, number={4}, journal={IBM Journal of Research and Development}, publisher={IBM}, author={Fang, F. and Triebwasser, S.}, year={1964}, month=sep, pages={410–415} }

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