Abstract
▪ Abstract This contribution summarizes the use of plasmon surface polaritons and guided optical waves for the characterization of interfaces and thin organic films. After a short introduction to the theoretical background of evanescent wave optics, examples are given that show how this interfacial “light” can be employed to monitor thin coatings at a solid/air or solid/liquid interface. Examples are given for a very sensitive thickness determination of samples ranging from self-assembled monolayers, to multilayer assemblies prepared by the Langmuir/Blodgett/Kuhn technique or by the alternate polyelectrolyte deposition. These are complemented by the demonstration of the potential of the technique to also monitor time-dependent processes in a kinetic mode. Here, we put an emphasis on the combination set-up of surface plasmon optics with electrochemical techniques, allowing for the on-line characterization of various surface functionalization strategies, e.g. for (bio-) sensor purposes.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 27, 2002, 7:46 a.m.) |
Deposited | 3 years, 10 months ago (Oct. 16, 2021, 11:39 a.m.) |
Indexed | 1 day, 21 hours ago (Aug. 30, 2025, 12:28 p.m.) |
Issued | 26 years, 11 months ago (Oct. 1, 1998) |
Published | 26 years, 11 months ago (Oct. 1, 1998) |
Published Print | 26 years, 11 months ago (Oct. 1, 1998) |
@article{Knoll_1998, title={INTERFACES AND THIN FILMS AS SEEN BY BOUND ELECTROMAGNETIC WAVES}, volume={49}, ISSN={1545-1593}, url={http://dx.doi.org/10.1146/annurev.physchem.49.1.569}, DOI={10.1146/annurev.physchem.49.1.569}, number={1}, journal={Annual Review of Physical Chemistry}, publisher={Annual Reviews}, author={Knoll, Wolfgang}, year={1998}, month=oct, pages={569–638} }