MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE
10.1146/annurev.matsci.35.102103.090513
Crossref journal-article
Annual Reviews
Annual Review of Materials Research (22)
Abstract

▪ Abstract  In the nanoscience era, the properties of many exciting new materials and devices will depend on the details of their composition down to the level of single atoms. Thus the characterization of the structure and electronic properties of matter at the atomic scale is becoming ever more vital for economic and technological as well as for scientific reasons. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) represents a powerful method to link the atomic and electronic structure to macroscopic properties, allowing materials, nanoscale systems, and interfaces to be probed in unprecedented detail. Z-contrast STEM uses electrons that have been scattered to large angles for imaging. The relative intensity of each atomic column is roughly proportional to Z2, where Z is the atomic number. Recent developments in correcting the aberrations of the lenses in the electron microscope have pushed the achievable spatial resolution and the sensitivity for imaging and spectroscopy in the STEM into the sub-Ångstrom (sub-Å) regime, providing a new level of insight into the structure/property relations of complex materials. Images acquired with an aberration-corrected instrument show greatly improved contrast. The signal-to-noise ratio is sufficiently high to allow sensitivity even to single atoms in both imaging and spectroscopy. This is a key achievement because the detection and measurement of the response of individual atoms has become a challenging issue to provide new insight into many fields, such as catalysis, ceramic materials, complex oxide interfaces, or grain boundaries. In this article, the state-of-the-art for the characterization of all of these different types of materials by means of aberration-corrected STEM and EELS are reviewed.

Bibliography

Varela, M., Lupini, A. R., Benthem, K. van, Borisevich, A. Y., Chisholm, M. F., Shibata, N., Abe, E., & Pennycook, S. J. (2005). MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE. Annual Review of Materials Research, 35(1), 539–569.

Authors 8
  1. M. Varela (first)
  2. A.R. Lupini (additional)
  3. K. van Benthem (additional)
  4. A.Y. Borisevich (additional)
  5. M.F. Chisholm (additional)
  6. N. Shibata (additional)
  7. E. Abe (additional)
  8. S.J. Pennycook (additional)
References 133 Referenced 186
  1. 10.1126/science.1100965
  2. 10.1016/S0304-3991(00)00126-1
  3. 10.1016/S0304-3991(99)00033-9
  4. 10.1103/PhysRevLett.92.095502
  5. 10.1038/nature00972
  6. 10.1038/nmat1077
  7. 10.1016/S1076-5670(02)80063-5
  8. 10.1007/978-94-011-4451-3_7
  9. 10.1046/j.1365-2818.1998.3260881.x
  10. 10.1063/1.1652901
  11. 10.1016/0304-3991(94)90092-2
  12. 10.1007/978-1-4757-2519-3
  13. 10.1017/S1431927605210309
  14. 10.1103/PhysRevLett.91.105503
  15. {'key': 'B15', 'first-page': '211', 'volume': '179', 'author': 'Lupini AR', 'year': '2004', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. by Lupini AR (2004)
  16. {'key': 'B16', 'first-page': '523', 'volume': '180', 'author': 'Lupini AR', 'year': '2003', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. by Lupini AR (2003)
  17. {'key': 'B17', 'first-page': '31', 'author': 'Lupini AR', 'year': '2001', 'journal-title': 'In st. Phys. Conf. Ser.'} / In st. Phys. Conf. Ser. by Lupini AR (2001)
  18. 10.1016/S0304-3991(79)80018-2
  19. 10.1093/jmicro/50.3.177
  20. 10.1007/BF01349606
  21. {'key': 'B20', 'first-page': '114', 'volume': '2', 'author': 'Scherzer O', 'year': '1947', 'journal-title': 'Optik'} / Optik by Scherzer O (1947)
  22. 10.1016/S0304-3991(99)00013-3
  23. 10.1016/S0304-3991(03)00090-1
  24. 10.1016/j.nima.2003.11.115
  25. 10.1093/jmicro/51.1.45
  26. 10.1093/jmicro/50.5.383
  27. 10.1093/oxfordjournals.jmicro.a023753
  28. {'key': 'B27', 'first-page': '241', 'volume': '53', 'author': 'Beck V', 'year': '1979', 'journal-title': 'Optik'} / Optik by Beck V (1979)
  29. {'key': 'B28', 'first-page': '391', 'volume': '56', 'author': 'Crewe AV', 'year': '1980', 'journal-title': 'Optik'} / Optik by Crewe AV (1980)
  30. 10.1038/33823
  31. 10.1103/PhysRevLett.81.4156
  32. 10.1016/S0304-3991(99)00017-0
  33. 10.1016/S1076-5670(00)80013-0
  34. {'key': 'B33', 'first-page': '1052', 'volume': '6', 'author': "Kel'man VM", 'year': '1961', 'journal-title': 'Sov. Phys. Tech. Phys.'} / Sov. Phys. Tech. Phys. by Kel'man VM (1961)
  35. Deltrap JHM. 1964. Correction of spherical aberration of electron lenses. PhD thesis. Univ. Cambridge, Cambridge, UK
  36. {'key': 'B35', 'volume-title': 'Heterogeneous Cat-alysis in Practice', 'author': 'Satterfield CN', 'year': '1980'} / Heterogeneous Cat-alysis in Practice by Satterfield CN (1980)
  37. {'key': 'B36', 'volume-title': 'Oxides and Hydroxides of Aluminum', 'author': 'Wefers K', 'year': '1987'} / Oxides and Hydroxides of Aluminum by Wefers K (1987)
  38. 10.1016/0926-860X(94)85160-3
  39. {'key': 'B38', 'first-page': '168', 'volume': '99', 'author': 'Glazov MV', 'year': '1999', 'journal-title': 'Alcoa Tech. Pap.'} / Alcoa Tech. Pap. by Glazov MV (1999)
  40. 10.1007/BF00274471
  41. 10.1016/0021-9517(88)90013-9
  42. 10.1016/S0166-9834(00)83128-0
  43. 10.1006/jssc.1996.7135
  44. 10.1107/S0909049500017106
  45. 10.1126/science.274.5286.413
  46. 10.1002/cphc.200400212
  47. 10.1126/science.281.5383.1647
  48. 10.1016/S0920-5861(96)00208-8
  49. 10.1007/BF03216579
  50. 10.1017/S1431927604040036
  51. 10.1351/pac199466091807
  52. 10.1111/j.1151-2916.1973.tb12401.x
  53. 10.1016/0079-6425(89)90005-4
  54. {'key': 'B53', 'first-page': '65', 'volume-title': 'Interfacial Engineering for Optimized Properties II', 'author': 'Hoffmann MJ', 'year': '2000'} / Interfacial Engineering for Optimized Properties II by Hoffmann MJ (2000)
  55. 10.1038/nature02410
  56. 10.1111/j.1151-2916.1996.tb07946.x
  57. 10.1557/PROC-238-859
  58. 10.1103/PhysRevB.50.7262
  59. For more details, visit http://www.pixon.com
  60. 10.1103/PhysRevB.70.144108
  61. 10.1038/nmat1244
  62. 10.1038/nature01337
  63. 10.1038/nmat1191
  64. 10.1038/366143a0
  65. 10.1093/oxfordjournals.jmicro.a023488
  66. {'key': 'B65', 'first-page': '173', 'volume': '65', 'author': 'Kohl H', 'year': '1985', 'journal-title': 'Adv. Imaging Electron Phys.'} / Adv. Imaging Electron Phys. by Kohl H (1985)
  67. 10.1016/0304-3991(95)00029-Z
  68. {'key': 'B67', 'first-page': '175', 'volume-title': 'Electron Microscopy and Analysis 1995', 'author': 'Holbrook OF', 'year': '1995'} / Electron Microscopy and Analysis 1995 by Holbrook OF (1995)
  69. 10.1016/S0304-3991(02)00380-7
  70. 10.1016/S0304-3991(02)00381-9
  71. 10.1126/science.264.5157.413
  72. 10.1103/PhysRevLett.71.2331
  73. 10.1016/S0370-1573(00)00121-6
  74. 10.1103/RevModPhys.73.583
  75. 10.1080/000187399243455
  76. {'key': 'B75', 'author': 'Varela M', 'year': '2005', 'journal-title': 'Nature'} / Nature by Varela M (2005)
  77. 10.1016/0304-3991(87)90030-1
  78. 10.1103/PhysRevB.26.614
  79. 10.1016/0304-3991(90)90077-Y
  80. 10.1016/0304-3991(90)90078-Z
  81. 10.1103/PhysRevB.47.8471
  82. 10.1103/PhysRevLett.78.1134
  83. 10.1063/1.1526463
  84. 10.1103/PhysRevB.67.214511
  85. 10.1103/PhysRevB.69.224502
  86. 10.1103/PhysRevB.69.134428
  87. 10.1103/PhysRevB.69.064505
  88. {'key': 'B87', 'author': 'Varela M', 'year': '2005', 'journal-title': 'Phys. Rev. Lett.'} / Phys. Rev. Lett. by Varela M (2005)
  89. 10.1016/S0038-1101(03)00205-3
  90. 10.1016/0921-4534(92)90289-O
  91. 10.1016/0921-4534(93)90501-G
  92. 10.1103/PhysRevB.17.4908
  93. {'key': 'B92', 'first-page': '635', 'volume-title': 'Materials Science and Technology A Comprehensive Treatment—Structure and Properties of Ceramics', 'volume': '11', 'author': 'Uchino K', 'year': '1994'} / Materials Science and Technology A Comprehensive Treatment—Structure and Properties of Ceramics by Uchino K (1994)
  94. 10.1016/0925-4005(94)01266-K
  95. 10.1016/S1359-6454(99)00293-1
  96. 10.1179/imr.1993.38.5.233
  97. 10.1179/imr.1993.38.5.257
  98. 10.1088/0953-8984/8/32/003
  99. 10.1016/S0304-3991(03)00112-8
  100. 10.3139/146.020362
  101. 10.1103/PhysRev.136.B864
  102. 10.1103/PhysRev.140.A1133
  103. {'key': 'B102', 'author': 'van Benthem K', 'year': '2005', 'journal-title': 'Phys. Rev. Lett.'} / Phys. Rev. Lett. by van Benthem K (2005)
  104. 10.1126/science.266.5190.1540
  105. 10.1016/S0039-6028(99)00383-0
  106. 10.1080/10584580108215697
  107. 10.3139/146.020406
  108. 10.1103/PhysRevB.72.125435
  109. 10.1088/0953-8984/2/19/006
  110. Meyer B, Elsaesser C, Lechermann F, Fahnle M. 2003. Fortran 90m program for mixed-basis pseudopotential calculations for crystals. Sttutgart: Max-Planck-Institut fuer Metallforschung
  111. {'key': 'B110', 'author': 'van Benthem K', 'year': '2005', 'journal-title': 'Phys. Stat. Sol.'} / Phys. Stat. Sol. by van Benthem K (2005)
  112. 10.1051/mmm:019930040102300
  113. 10.1111/j.1365-2818.1995.tb03652.x
  114. 10.1002/1521-3951(200011)222:1<199::AID-PSSB199>3.0.CO;2-2
  115. 10.1046/j.1365-2818.2002.01036.x
  116. 10.1126/science.285.5436.2079
  117. {'key': 'B116', 'first-page': '38', 'volume': '38', 'author': 'Moore G', 'year': '1965', 'journal-title': 'Electronics'} / Electronics by Moore G (1965)
  118. 10.5210/fm.v7i11.1000
  119. {'key': 'B118', 'author': 'van Benthem K', 'year': '2005', 'journal-title': 'Science.'} / Science. by van Benthem K (2005)
  120. 10.1016/S0304-3991(03)00096-2
  121. 10.1038/416826a
  122. 10.1007/978-3-662-14824-2
  123. {'key': 'B122', 'author': 'van Benthem K', 'year': '2005', 'journal-title': 'Appl. Phys. Lett'} / Appl. Phys. Lett by van Benthem K (2005)
  124. 10.1126/science.237.4821.1439
  125. 10.1103/PhysRevLett.90.175501
  126. 10.1103/PhysRevLett.89.155502
  127. 10.1038/217130a0
  128. 10.1016/S0304-3991(03)00105-0
  129. 10.1021/jp0015628
  130. 10.1126/science.288.5464.319
  131. 10.1093/jmicro/53.3.257
  132. 10.1103/PhysRevLett.92.116103
  133. 10.1103/PhysRevLett.94.025504
Dates
Type When
Created 20 years, 4 months ago (April 1, 2005, 8:50 p.m.)
Deposited 3 years, 10 months ago (Oct. 13, 2021, 6:27 p.m.)
Indexed 2 weeks, 6 days ago (Aug. 6, 2025, 9:42 a.m.)
Issued 20 years ago (Aug. 4, 2005)
Published 20 years ago (Aug. 4, 2005)
Published Print 20 years ago (Aug. 4, 2005)
Funders 0

None

@article{Varela_2005, title={MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE}, volume={35}, ISSN={1545-4118}, url={http://dx.doi.org/10.1146/annurev.matsci.35.102103.090513}, DOI={10.1146/annurev.matsci.35.102103.090513}, number={1}, journal={Annual Review of Materials Research}, publisher={Annual Reviews}, author={Varela, M. and Lupini, A.R. and Benthem, K. van and Borisevich, A.Y. and Chisholm, M.F. and Shibata, N. and Abe, E. and Pennycook, S.J.}, year={2005}, month=aug, pages={539–569} }