Crossref journal-article
Annual Reviews
Annual Review of Materials Science (22)
Abstract

▪ Abstract  Perovskite, ferroelectric and paraelectric, thin films exhibit outstanding dielectric properties, even at high frequencies (>1 GHz). This feature makes films such as (Ba,Sr)TiO3and Pb(Zr,Ti)O3ideally suited for a wide range of capacitor applications, particularly decoupling capacitors and tunable microwave capacitors; the latter application has been fueled by the recent explosion in wireless communications. The successful implementation of these materials as high-frequency dielectrics requires a detailed understanding of both their processing and materials properties.

Bibliography

Dimos, D., & Mueller, C. H. (1998). PEROVSKITE THIN FILMS FOR HIGH-FREQUENCY CAPACITOR APPLICATIONS. Annual Review of Materials Science, 28(1), 397–419.

Authors 2
  1. D. Dimos (first)
  2. C. H. Mueller (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 27, 2002, 7:40 a.m.)
Deposited 8 months, 2 weeks ago (Dec. 8, 2024, 5:34 p.m.)
Indexed 2 months ago (June 24, 2025, 7:28 a.m.)
Issued 27 years ago (Aug. 1, 1998)
Published 27 years ago (Aug. 1, 1998)
Published Print 27 years ago (Aug. 1, 1998)
Funders 0

None

@article{Dimos_1998, title={PEROVSKITE THIN FILMS FOR HIGH-FREQUENCY CAPACITOR APPLICATIONS}, volume={28}, ISSN={0084-6600}, url={http://dx.doi.org/10.1146/annurev.matsci.28.1.397}, DOI={10.1146/annurev.matsci.28.1.397}, number={1}, journal={Annual Review of Materials Science}, publisher={Annual Reviews}, author={Dimos, D. and Mueller, C. H.}, year={1998}, month=aug, pages={397–419} }