DOI: 10.1146/annurev.matsci.28.1.101. IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY

IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY

10.1146/annurev.matsci.28.1.101

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Annual Reviews

Annual Review of Materials Science (22)

Abstract

▪ Abstract Scanning force microscopy (SFM) is becoming a powerful technique with great potential both for imaging and for control of domain structures in ferroelectric materials at the nanometer scale. Application of SFM to visualization of domain structures in ferroelectric thin films is described. Imaging methods of ferroelectric domains are based on the detection of surface charges in the noncontact mode of SFM and on the measurement of the piezoelectric response of a ferroelectric film to an external field applied by the tip in the SFM contact mode. This latter mode can be used for nondestructive evaluation of local ferroelectric and piezoelectric properties and for manipulation of domains of less than 50 nm in diameter. The effect of the film thickness and crystallinity on the imaging resolution is discussed. Scanning force microscopy is shown to be a technique well suited for nanoscale investigation of switching processes and electrical degradation effects in ferroelectric thin films.

Bibliography

Gruverman, A., Auciello, O., & Tokumoto, H. (1998). IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY. Annual Review of Materials Science, 28(1), 101â123.

Authors 3

Alexei Gruverman (first)
Orlando Auciello (additional)
Hiroshi Tokumoto (additional)

References 42 Referenced 462

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Dates

Type	When
Created	23 years ago (July 27, 2002, 7:43 a.m.)
Deposited	3 years, 10 months ago (Oct. 13, 2021, 4:09 p.m.)
Indexed	2 weeks ago (Aug. 7, 2025, 4:25 p.m.)
Issued	27 years ago (Aug. 1, 1998)
Published	27 years ago (Aug. 1, 1998)
Published Print	27 years ago (Aug. 1, 1998)

Funders 0

None

BibTeX

@article{Gruverman_1998, title={IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY}, volume={28}, ISSN={0084-6600}, url={http://dx.doi.org/10.1146/annurev.matsci.28.1.101}, DOI={10.1146/annurev.matsci.28.1.101}, number={1}, journal={Annual Review of Materials Science}, publisher={Annual Reviews}, author={Gruverman, Alexei and Auciello, Orlando and Tokumoto, Hiroshi}, year={1998}, month=aug, pages={101–123} }

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