DOI: 10.1146/annurev.matsci.27.1.175. CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPY

CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPY

10.1146/annurev.matsci.27.1.175

Crossref journal-article

Annual Reviews

Annual Review of Materials Science (22)

Abstract

▪ Abstract Applications of state-of-the-art atomic force microscopy methods to the elucidation of the surface and near-surface structure of polymeric solids are described. Contact, tapping, force modulation, frictional force, and other modes of atomic force microscopy are described, and recent results are summarized. Conformational and chain order, crystalline order, polymer crystals, lamellar structures, lamellar surfaces, fold surfaces, and fibers and films with highly oriented molecules all yield important information. Controlled deformation of polymer surfaces, both reversible and irreversible, with the atomic force microscope, provides a wealth of information about mechanical properties on a nanometer scale. The observation of phase-separated regions and of polymer crystals lying below a smooth surface shows that not only topography but also elastic inhomogeneity can be observed in great detail with the atomic force microscope. This is a rapidly developing field, and some indications of future developments are presented.

Bibliography

Magonov, S. N., & Reneker, D. H. (1997). CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPY. Annual Review of Materials Science, 27(1), 175â222.

Authors 2

Sergei N. Magonov (first)
Darrell H. Reneker (additional)

References 71 Referenced 381

10.1093/oso/9780195071504.001.0001 / Introduction to Scanning Tunneling Microscopy. by Chen CJ (1993)
{'key': 'b2', 'volume-title': 'Scanning Tunneling Microscopy and Spectroscopy.', 'author': 'Bonnell DA', 'year': '1993'} / Scanning Tunneling Microscopy and Spectroscopy. by Bonnell DA (1993)
{'key': 'b3', 'volume-title': 'Surface Analysis with STM and AFM.', 'author': 'Magonov SN', 'year': '1996'} / Surface Analysis with STM and AFM. by Magonov SN (1996)
10.1063/1.341881
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Dates

Type	When
Created	23 years, 1 month ago (July 27, 2002, 7:43 a.m.)
Deposited	1 year, 7 months ago (Jan. 5, 2024, 11:57 p.m.)
Indexed	2 weeks, 5 days ago (Aug. 12, 2025, 5:53 p.m.)
Issued	28 years, 1 month ago (Aug. 1, 1997)
Published	28 years, 1 month ago (Aug. 1, 1997)
Published Print	28 years, 1 month ago (Aug. 1, 1997)

Funders 0

None

BibTeX

@article{Magonov_1997, title={CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPY}, volume={27}, ISSN={0084-6600}, url={http://dx.doi.org/10.1146/annurev.matsci.27.1.175}, DOI={10.1146/annurev.matsci.27.1.175}, number={1}, journal={Annual Review of Materials Science}, publisher={Annual Reviews}, author={Magonov, Sergei N. and Reneker, Darrell H.}, year={1997}, month=aug, pages={175–222} }

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