Atom Probe Tomography 2012
10.1146/annurev-matsci-070511-155007
Crossref journal-article
Annual Reviews
Annual Review of Materials Research (22)
Abstract

In the world of tomographic imaging, atom probe tomography (APT) occupies the high-spatial-resolution end of the spectrum. It is highly complementary to electron tomography and is applicable to a wide range of materials. The current state of APT is reviewed. Emphasis is placed on applications and data analysis as they apply to many fields of research and development including metals, semiconductors, ceramics, and organic materials. We also provide a brief review of the history and the instrumentation associated with APT and an assessment of the existing challenges in the field.

Bibliography

Kelly, T. F., & Larson, D. J. (2012). Atom Probe Tomography 2012. Annual Review of Materials Research, 42(1), 1–31.

Authors 2
  1. Thomas F. Kelly (first)
  2. David J. Larson (additional)
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Dates
Type When
Created 13 years, 1 month ago (June 21, 2012, 10:26 p.m.)
Deposited 1 year, 3 months ago (April 25, 2024, 8:07 p.m.)
Indexed 1 week, 1 day ago (Aug. 12, 2025, 6:01 p.m.)
Issued 13 years ago (Aug. 4, 2012)
Published 13 years ago (Aug. 4, 2012)
Published Print 13 years ago (Aug. 4, 2012)
Funders 0

None

@article{Kelly_2012, title={Atom Probe Tomography 2012}, volume={42}, ISSN={1545-4118}, url={http://dx.doi.org/10.1146/annurev-matsci-070511-155007}, DOI={10.1146/annurev-matsci-070511-155007}, number={1}, journal={Annual Review of Materials Research}, publisher={Annual Reviews}, author={Kelly, Thomas F. and Larson, David J.}, year={2012}, month=aug, pages={1–31} }