Abstract
In this research, ambipolar behavior, which is one of graphene's unique characteristics, is studied for the epitaxial graphene formed on 3C-SiC grown on a Si substrate. The graphene channel is believed to be unintentionally p-type-doped at Dirac-point voltages of approximately +0.11 to +0.12 V. However, as drain voltage negatively increases, Dirac point voltage shifts. The drain current in the p-channel mode of operation saturates at a lower level than that in the n-channel mode of operation. These behaviors are caused by asymmetric carrier transport throughout channel-substrate heterojunctions (i.e., graphene, thin n-type SiC layer, and p-type Si substrate) and source/drain Schottky metal contacts. The interface between the p-type Si substrate and n-type SiC has a significant effect on transport in graphene channels. The results may be helpful for understanding transport in the device and for suppressing ambipolar operation, leading to a unipolar FET operation.
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Dates
Type | When |
---|---|
Created | 15 years, 2 months ago (June 21, 2010, 2:37 a.m.) |
Deposited | 2 years, 7 months ago (Jan. 5, 2023, 2:33 p.m.) |
Indexed | 6 months ago (Feb. 21, 2025, 5:37 a.m.) |
Issued | 15 years, 2 months ago (June 1, 2010) |
Published | 15 years, 2 months ago (June 1, 2010) |
Published Online | 15 years, 2 months ago (June 21, 2010) |
Published Print | 15 years, 2 months ago (June 1, 2010) |
@article{Olac_vaw_2010, title={Ambipolar Behavior in Epitaxial Graphene-Based Field-Effect Transistors on Si Substrate}, volume={49}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.49.06gg01}, DOI={10.1143/jjap.49.06gg01}, number={6S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Olac-vaw, Roman and Kang, Hyun-Chul and Karasawa, Hiromi and Miyamoto, Yu and Handa, Hiroyuki and Fukidome, Hirokazu and Suemitsu, Tetsuya and Suemitsu, Maki and Otsuji, Taiichi}, year={2010}, month=jun, pages={06GG01} }