DOI: 10.1143/jjap.42.7163. The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping

The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping

10.1143/jjap.42.7163

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Bibliography

Okamoto, K., Sugawara, Y., & Morita, S. (2003). The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping. Japanese Journal of Applied Physics, 42(Part 1, No. 11), 7163â7168.

Authors 3

Kenji Okamoto (first)
Yasuhiro Sugawara (additional)
Seizo Morita (additional)

References 0 Referenced 18

None

Dates

Type	When
Created	21 years, 8 months ago (Dec. 26, 2003, 7:29 a.m.)
Deposited	5 years, 3 months ago (May 31, 2020, 6:58 p.m.)
Indexed	1 year ago (Sept. 2, 2024, 7:10 p.m.)
Issued	21 years, 9 months ago (Nov. 10, 2003)
Published	21 years, 9 months ago (Nov. 10, 2003)
Published Online	21 years, 9 months ago (Nov. 10, 2003)

Funders 0

None

BibTeX

@article{Okamoto_2003, title={The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping}, volume={42}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.42.7163}, DOI={10.1143/jjap.42.7163}, number={Part 1, No. 11}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Okamoto, Kenji and Sugawara, Yasuhiro and Morita, Seizo}, year={2003}, month=nov, pages={7163–7168} }

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