DOI: 10.1143/jjap.40.4373. Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers

Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers

10.1143/jjap.40.4373

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

A difference in surface potentials between organosilane self-assembled monolayers (SAMs) was measured by means of Kelvin probe force microscopy (KFM). The SAMs were deposited on a single Si substrate from alkylsilane, that is, octadecyltrimethoxysilane (ODS) [H3C(CH2)17Si(OCH3)3], and fluoroalkylsilane (FAS), that is, heptadecafluoro-1,1,2,2-tetrahydro-decyl-1-trimethoxysilane [F3C(CF2)7(CH2)2Si(OCH3)3]. The locations of these SAMs on the substrate were defined by means of a photolithographic technique. The regions terminated with ODS and FAS were clearly distinguished by KFM with the surface potential difference between the ODS- and FAS-terminated surfaces under optimized imaging conditions. The surface potential of the FAS-terminated region was 170∼180 mV lower than the potential of the ODS-terminated surface. The origin of such a low surface potential of FAS-SAM was ascribed to the larger dipole moment of the FAS molecule induced by the electron negativity of F atoms as estimated from a molecular orbital calculation.

Bibliography

Hiroyuki Sugimura, H. S., Kazuyuki Hayashi, K. H., Nagahiro Saito, N. S., Osamu Takai, O. T., & Nobuyuki Nakagiri, N. N. (2001). Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers. Japanese Journal of Applied Physics, 40(6S), 4373.

Authors 5

Hiroyuki Sugimura Hiroyuki Sugimura (first)
Kazuyuki Hayashi Kazuyuki Hayashi (additional)
Nagahiro Saito Nagahiro Saito (additional)
Osamu Takai Osamu Takai (additional)
Nobuyuki Nakagiri Nobuyuki Nakagiri (additional)

References 18 Referenced 39

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10.1063/1.105227 / Appl. Phys. Lett. (1991)
{'key': ''}
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10.1016/0040-6090(94)90497-9 / Thin Solid Films (1994)
10.1063/1.1146874 / Rev. Sci. Instrum. (1996)
10.1016/0040-6090(95)06772-8 / Thin Solid Films (1996)
10.1116/1.589765 / J. Vac. Sci. & Technol. B (1998)
10.1021/la9904861 / Langmuir (1999)
10.1016/S0169-4332(99)00558-9 / Appl. Surf. Sci. (2000)
10.1143/JJAP.40.L174 / Jpn. J. Appl. Phys. (2001)
10.2494/photopolymer.10.661 / J. Photopolym. Sci. Technol. (1997)
10.1021/la9809067 / Langmuir (1999)
10.1021/la990953e / Langmuir (2000)
10.2494/photopolymer.13.69 / J. Photopolym. Sci. Technol. (2000)
{'key': ''}
10.1016/S0001-8686(99)00044-5 / Adv. Colloid Interface Sci. (2000)
10.1016/S0927-7757(00)00444-1 / Colloids Surf. A (2000)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 1, 2002, 4:34 p.m.)
Deposited	2 years, 8 months ago (Dec. 19, 2022, 12:25 p.m.)
Indexed	6 months ago (Feb. 21, 2025, 5:32 a.m.)
Issued	24 years, 2 months ago (June 1, 2001)
Published	24 years, 2 months ago (June 1, 2001)
Published Print	24 years, 2 months ago (June 1, 2001)

Funders 0

None

BibTeX

@article{Hiroyuki_Sugimura_2001, title={Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers}, volume={40}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.40.4373}, DOI={10.1143/jjap.40.4373}, number={6S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Hiroyuki Sugimura, Hiroyuki Sugimura and Kazuyuki Hayashi, Kazuyuki Hayashi and Nagahiro Saito, Nagahiro Saito and Osamu Takai, Osamu Takai and Nobuyuki Nakagiri, Nobuyuki Nakagiri}, year={2001}, month=jun, pages={4373} }

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