Abstract
We propose paramorphic growth as a new approach for growing thick, ideally relaxed, epitaxial layers on mismatched substrates. First, a thin seed layer, originally grown pseudomorphically strained on a mismatched substrate coated with a sacrificial layer, is separated by chemical etching from its original substrate and subsequently deposited on the final substrate after being elastically relaxed. Consequently, thick layers, lattice matched to the cubic-relaxed seed layer, can be grown epitaxially without the introduction of any structural defects. The validity of this approach is demonstrated by growing fully relaxed In0.65Ga0.35As thick layers on 300×300 µm2 platforms deposited on an InP substrate, using molecular beam epitaxy.
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(1995)
Dates
Type | When |
---|---|
Created | 22 years, 11 months ago (Oct. 1, 2002, 4:51 p.m.) |
Deposited | 2 years, 8 months ago (Dec. 14, 2022, 12:52 p.m.) |
Indexed | 6 months, 1 week ago (Feb. 21, 2025, 5:33 a.m.) |
Issued | 26 years ago (Sept. 1, 1999) |
Published | 26 years ago (Sept. 1, 1999) |
Published Print | 26 years ago (Sept. 1, 1999) |
@article{Damlencourt_1999, title={Paramorphic Growth: A New Approach in Mismatched Heteroepitaxy to Prepare Fully Relaxed Materials}, volume={38}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.38.l996}, DOI={10.1143/jjap.38.l996}, number={9A}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Damlencourt, Jean-François and Leclercq, Jean-Louis and Gendry, Michel and Garrigues, Michel and Aberkane, Nabil and Hollinger, Guy}, year={1999}, month=sep, pages={L996} }