Abstract
We present reflectivity measurements allowing the quantitative determination of crystallization times from 103 s down to 10-8 s. For the slow speeds the crystallization of a written mark at constant temperatures is monitored. For the fast speeds time resolved measurements are employed. The presented experimental methods show a high potential to yield information on stoichiometry induced variation of the crystallization speed and on the physical mechanism of phase change processes.
References
2
Referenced
15
10.1063/1.359779
/ J. Appl. Phys. (1995){'year': '1975', 'key': ''}
(1975)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 1, 2002, 6:45 p.m.) |
Deposited | 2 years, 8 months ago (Dec. 14, 2022, 12:07 p.m.) |
Indexed | 6 months ago (Feb. 21, 2025, 5:33 a.m.) |
Issued | 27 years, 4 months ago (April 1, 1998) |
Published | 27 years, 4 months ago (April 1, 1998) |
Published Print | 27 years, 4 months ago (April 1, 1998) |
@article{Trappe_1998, title={Real Time Measurements of Phase Change Dynamics}, volume={37}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.37.2114}, DOI={10.1143/jjap.37.2114}, number={4S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Trappe, Cyril and Béchevet, Bernard and Facsko, Stefan and Kurz, Heinrich}, year={1998}, month=apr, pages={2114} }