DOI: 10.1143/jjap.35.5178. Origin of Dielectric Relaxation Observed for Ba0.5Sr0.5TiO3 Thin-Film Capacitor

Origin of Dielectric Relaxation Observed for Ba0.5Sr0.5TiO3 Thin-Film Capacitor

10.1143/jjap.35.5178

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Bibliography

Fukuda, Y., Numata, K., Katsuhiro Aoki, K. A., & Akitoshi Nishimura, A. N. (1996). Origin of Dielectric Relaxation Observed for Ba0.5Sr0.5TiO3 Thin-Film Capacitor. Japanese Journal of Applied Physics, 35(9S), 5178.

Authors 4

Yukio Fukuda (first)
Ken Numata (additional)
Katsuhiro Aoki Katsuhiro Aoki (additional)
Akitoshi Nishimura Akitoshi Nishimura (additional)

References 9 Referenced 61

10.1143/JJAP.33.5255 / Jpn. J. Appl. Phys. (1994)
10.1143/JJAP.34.5478 / Jpn. J. Appl. Phys. (1995)
10.1080/10584589508220240 / Integr. Ferroelectr. (1995)
{'year': '1995', 'key': '[4]'} (1995)
10.1143/JJAP.34.L1291 / Jpn. J. Appl. Phys. (1995)
10.1111/j.1151-2916.1989.tb06073.x / J. Am. Ceram. Soc. (1989)
10.1111/j.1151-2916.1989.tb06067.x / J. Am. Ceram. Soc. (1989)
{'year': '1973', 'key': '[8]'} (1973)
10.1143/JJAP.35.1548 / Jpn. J. Appl. Phys. (1996)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 1, 2002, 5:03 p.m.)
Deposited	1 year, 8 months ago (Dec. 6, 2023, 11:47 a.m.)
Indexed	2 months ago (June 24, 2025, 7:28 a.m.)
Issued	28 years, 11 months ago (Sept. 1, 1996)
Published	28 years, 11 months ago (Sept. 1, 1996)
Published Print	28 years, 11 months ago (Sept. 1, 1996)

Funders 0

None

BibTeX

@article{Fukuda_1996, title={Origin of Dielectric Relaxation Observed for Ba0.5Sr0.5TiO3 Thin-Film Capacitor}, volume={35}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.35.5178}, DOI={10.1143/jjap.35.5178}, number={9S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Fukuda, Yukio and Numata, Ken and Katsuhiro Aoki, Katsuhiro Aoki and Akitoshi Nishimura, Akitoshi Nishimura}, year={1996}, month=sep, pages={5178} }

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