DOI: 10.1143/jjap.35.4900. Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature

Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature

10.1143/jjap.35.4900

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

Ferroelectric properties, crystal structure and microstructures were examined for various Sr/Bi/Ta atomic ratio strontium bismuth tantalate (SBT) films prepared by metalorganic decomposition at 700 and 800° C. The 20% Sr-deficient and 10% Bi-excess (0.8/2.2/2) composition showed maximum remanent polarization (P r) values for both 700 and 800° C crystallization temperatures. From TEM analysis, the P r dependence on composition variation around the stoichiometric 1/2/2 composition was related to grain size and volume of voids. The effect of postannealing after Pt top electrode fabrication was also studied. On the films prepared at 800° C, postannealing markedly reduced the capacitor shorting rate. This was attributed to recrystallization of the Pt top layer, based on SEM analysis of the Pt layer and the Pt/SBT interface.

Bibliography

Noguchi, T., Takashi Hase, T. H., & Yoichi Miyasaka, Y. M. (1996). Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature. Japanese Journal of Applied Physics, 35(9S), 4900.

Authors 3

Takehiro Noguchi (first)
Takashi Hase Takashi Hase (additional)
Yoichi Miyasaka Yoichi Miyasaka (additional)

References 8 Referenced 183

10.1038/374627a0 / Nature (1995)
10.1063/1.113140 / Appl. Phys. Lett. (1995)
10.1557/PROC-361-21 / Mater. Res. Soc. Symp. Proc. (1995)
10.1143/JJAP.34.5069 / Jpn. J. Appl. Phys. (1995)
10.1143/JJAP.34.5240 / Jpn. J. Appl. Phys. (1995)
{'journal-title': 'Integr. Ferroelectr.', 'key': ''} / Integr. Ferroelectr.
{'key': ''}
10.1080/10584589508012303 / Integr. Ferroelectr. (1995)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 1, 2002, 5:03 p.m.)
Deposited	2 years, 8 months ago (Dec. 7, 2022, 1:20 p.m.)
Indexed	1 month, 3 weeks ago (July 7, 2025, 9:25 a.m.)
Issued	28 years, 11 months ago (Sept. 1, 1996)
Published	28 years, 11 months ago (Sept. 1, 1996)
Published Print	28 years, 11 months ago (Sept. 1, 1996)

Funders 0

None

BibTeX

@article{Noguchi_1996, title={Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature}, volume={35}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.35.4900}, DOI={10.1143/jjap.35.4900}, number={9S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Noguchi, Takehiro and Takashi Hase, Takashi Hase and Yoichi Miyasaka, Yoichi Miyasaka}, year={1996}, month=sep, pages={4900} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        7
      ]
    ],
    "date-time": "2025-07-07T13:25:25Z",
    "timestamp": 1751894725178,
    "version": "3.37.3"
  },
  "reference-count": 8,
  "publisher": "IOP Publishing",
  "issue": "9S",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1996,
            9,
            1
          ]
        ],
        "date-time": "1996-09-01T00:00:00Z",
        "timestamp": 841536000000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://iopscience.iop.org/page/copyright"
    },
    {
      "start": {
        "date-parts": [
          [
            1996,
            9,
            1
          ]
        ],
        "date-time": "1996-09-01T00:00:00Z",
        "timestamp": 841536000000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://iopscience.iop.org/info/page/text-and-data-mining"
    }
  ],
  "content-domain": {
    "domain": [
      "iopscience.iop.org"
    ],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1996,
        9,
        1
      ]
    ]
  },
  "abstract": "<jats:p> \n   Ferroelectric properties, crystal structure and microstructures were examined for various Sr/Bi/Ta atomic ratio strontium bismuth tantalate (SBT) films prepared by metalorganic decomposition at 700 and 800\u00b0 C. The 20% Sr-deficient and 10% Bi-excess (0.8/2.2/2) composition showed maximum remanent polarization (<jats:italic>P</jats:italic>\n                  <jats:sub> r</jats:sub>) values for both 700 and 800\u00b0 C crystallization temperatures. From TEM analysis, the  \n   <jats:italic>P</jats:italic>\n                  <jats:sub> r</jats:sub> dependence on composition variation around the stoichiometric 1/2/2 composition was related to grain size and volume of voids. The effect of postannealing after Pt top electrode fabrication was also studied. On the films prepared at 800\u00b0 C, postannealing markedly reduced the capacitor shorting rate. This was attributed to recrystallization of the Pt top layer, based on SEM analysis of the Pt layer and the Pt/SBT interface. \n   </jats:p>",
  "DOI": "10.1143/jjap.35.4900",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        10,
        1
      ]
    ],
    "date-time": "2002-10-01T21:03:51Z",
    "timestamp": 1033506231000
  },
  "page": "4900",
  "update-policy": "https://doi.org/10.1088/crossmark-policy",
  "source": "Crossref",
  "is-referenced-by-count": 183,
  "title": "Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth  Tantalate (SBT) Thin Films on the Composition and Process Temperature",
  "prefix": "10.35848",
  "volume": "35",
  "author": [
    {
      "given": "Takehiro",
      "family": "Noguchi",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Takashi Hase",
      "family": "Takashi Hase",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Yoichi Miyasaka",
      "family": "Yoichi Miyasaka",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "266",
  "reference": [
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "627",
      "DOI": "10.1038/374627a0",
      "volume": "374",
      "year": "1995",
      "journal-title": "Nature"
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "9",
      "DOI": "10.1063/1.113140",
      "volume": "66",
      "year": "1995",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "21",
      "DOI": "10.1557/PROC-361-21",
      "volume": "361",
      "year": "1995",
      "journal-title": "Mater. Res. Soc. Symp. Proc."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "5069",
      "DOI": "10.1143/JJAP.34.5069",
      "volume": "34",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "5240",
      "DOI": "10.1143/JJAP.34.5240",
      "volume": "34",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "journal-title": "Integr. Ferroelectr.",
      "key": ""
    },
    {
      "key": ""
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "89",
      "DOI": "10.1080/10584589508012303",
      "volume": "8",
      "year": "1995",
      "journal-title": "Integr. Ferroelectr."
    }
  ],
  "container-title": "Japanese Journal of Applied Physics",
  "original-title": [],
  "link": [
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.35.4900",
      "content-type": "text/html",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.35.4900/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.35.4900/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.35.4900/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2022,
        12,
        7
      ]
    ],
    "date-time": "2022-12-07T18:20:53Z",
    "timestamp": 1670437253000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.35.4900"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1996,
        9,
        1
      ]
    ]
  },
  "references-count": 8,
  "journal-issue": {
    "issue": "9S",
    "published-print": {
      "date-parts": [
        [
          1996,
          9,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1143/JJAP.35.4900",
  "relation": {},
  "ISSN": [
    "0021-4922",
    "1347-4065"
  ],
  "subject": [],
  "container-title-short": "Jpn. J. Appl. Phys.",
  "published": {
    "date-parts": [
      [
        1996,
        9,
        1
      ]
    ]
  },
  "assertion": [
    {
      "value": "Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth  Tantalate (SBT) Thin Films on the Composition and Process Temperature",
      "name": "article_title",
      "label": "Article Title"
    },
    {
      "value": "Japanese Journal of Applied Physics",
      "name": "journal_title",
      "label": "Journal Title"
    },
    {
      "value": "paper",
      "name": "article_type",
      "label": "Article Type"
    },
    {
      "value": "Copyright (c) 1996 The Japan Society of Applied Physics",
      "name": "copyright_information",
      "label": "Copyright Information"
    },
    {
      "value": "1996-05-30",
      "name": "date_received",
      "label": "Date Received",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    },
    {
      "value": "1996-06-28",
      "name": "date_accepted",
      "label": "Date Accepted",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    },
    {
      "name": "date_epub",
      "label": "Online publication date",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    }
  ]
}