DOI: 10.1143/jjap.35.3787. Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever

Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever

10.1143/jjap.35.3787

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

We propose a novel atomic force microscope (AFM) combined with ultrasonic frequency vibration of a cantilever excited at its support. This method enables both topography and elasticity imaging of stiff samples such as metals and ceramics, without a need for bonding a transducer to the sample. When the sample surface is contacted with a tip attached to the cantilever, the cantilever vibration mode is changed according to the sample properties. It is theoretically predicted that the amplitude and resonant frequency of vibration at higher-order modes are useful parameters for elasticity evaluation of stiff samples. A preliminary experimental verification of this principle is presented using a glass-fiber-reinforced plastic sample. Clear elastic contrast was successfully obtained using a soft cantilever only when it was vibrated at MHz frequency higher-order modes.

Bibliography

Kazushi Yamanaka, K. Y., & Shizuka Nakano, S. N. (1996). Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever. Japanese Journal of Applied Physics, 35(6S), 3787.

Authors 2

Kazushi Yamanaka Kazushi Yamanaka (first)
Shizuka Nakano Shizuka Nakano (additional)

References 18 Referenced 152

10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1002/pssa.2211310111 / Phys. Status Solidi (a) (1992)
10.1143/JJAP.32.L1095 / Jpn. J. Appl. Phys. (1993)
10.1063/1.111524 / Appl. Phys. Lett. (1994)
10.1143/JJAP.33.3197 / Jpn. J. Appl. Phys. (1994)
10.1016/0040-6090(95)06802-3 / Thin Sol. Films (1996)
10.1063/1.111869 / Appl. Phys. Lett. (1994)
10.1002/andp.19945060704 / Ann. Phys. (1994)
{'key': ''}
{'key': '', 'first-page': '12', 'volume': '5', 'year': '1994', 'journal-title': 'Nanotechnology'} / Nanotechnology (1994)
10.1016/S0006-3495(93)81433-4 / Biophys. J. (1993)
10.1088/0957-4484/2/2/004 / Nanotechnology (1991)
{'key': ''}
10.1063/1.338807 / J. Appl. Phys. (1987)
{'key': ''}
10.1088/0957-4484/6/1/001 / Nanotechnology (1995)
{'key': ''}
10.1557/JMR.1992.1564 / J. Mater. Res. (1992)

Dates

Type	When
Created	22 years, 11 months ago (Oct. 1, 2002, 5:20 p.m.)
Deposited	2 years, 8 months ago (Dec. 7, 2022, 1:13 p.m.)
Indexed	2 months, 1 week ago (June 24, 2025, 3:47 a.m.)
Issued	29 years, 3 months ago (June 1, 1996)
Published	29 years, 3 months ago (June 1, 1996)
Published Print	29 years, 3 months ago (June 1, 1996)

Funders 0

None

BibTeX

@article{Kazushi_Yamanaka_1996, title={Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever}, volume={35}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.35.3787}, DOI={10.1143/jjap.35.3787}, number={6S}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Kazushi Yamanaka, Kazushi Yamanaka and Shizuka Nakano, Shizuka Nakano}, year={1996}, month=jun, pages={3787} }

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