Abstract
Unlike ultrahigh vacuum (UHV) scanning tunneling microscopy (STM), the effectiveness of UHV in UHV atomic force microscopy (AFM) has not been verified. Intensive interaction between tip and sample in UHV often damages the sample surface in the contact mode. Although noncontact (NC) AFM is effective in protecting the sample surface, it has failed to provide atomic-level resolution. We used a stiff silicon cantilever ( ∼40 N/m) capable of STM imaging, and succeeded in obtaining the first atomic-resolution images of Si(111)7×7 reconstruction in NC AFM at a tip-sample distance almost equal to that for STM imaging.
References
9
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Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 1, 2002, 4:18 p.m.) |
Deposited | 2 years, 8 months ago (Dec. 7, 2022, 12:34 p.m.) |
Indexed | 4 months, 3 weeks ago (March 31, 2025, 12:26 a.m.) |
Issued | 30 years, 7 months ago (Jan. 1, 1995) |
Published | 30 years, 7 months ago (Jan. 1, 1995) |
Published Print | 30 years, 7 months ago (Jan. 1, 1995) |
@article{Kitamura_1995, title={Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy}, volume={34}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.34.l145}, DOI={10.1143/jjap.34.l145}, number={1B}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Kitamura, Shin-ichi and Masashi Iwatsuki, Masashi Iwatsuki}, year={1995}, month=jan, pages={L145} }