DOI: 10.1143/jjap.34.25. Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface

Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface

10.1143/jjap.34.25

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

The electron charge of Si adsorbates evaporated on a Si(001)-2×1 surface is studied by tracing their behavior after heating of the substrate. A reflection electron microscope (REM) is used to observe denuded zones which are created at the terrace edge and grow with heating time. It is shown that two effects affect the adsorbates. One is the thermal effect, where the zone width (x) is proportional to the square root of heating time (t). The other is the electric effect, where x is proportional to t. At the critical time t c , the electric effect becomes a dominant force and the Si adsorbates migrate independently on the substrate surface. In the region of t>t c, the adsorbates show the features of surface electromigration caused by the electric field. The adsorbates migrate in the same direction as that of the electric field applied for substrate heating. The results indicate that Si adsorbates are positively charged on the Si(001) surface.

Bibliography

Doi, T., & Ichikawa, M. (1995). Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface. Japanese Journal of Applied Physics, 34(1R), 25.

Authors 2

Takahisa Doi (first)
Masakazu Ichikawa (additional)

References 6 Referenced 10

{'key': '', 'first-page': '529', 'volume': '48', 'year': '1988', 'journal-title': 'JETP Lett.'} / JETP Lett. (1988)
10.1143/JJAP.28.L303 / Jpn. J. Appl. Phys. (1989)
10.1103/PhysRevB.39.5524 / Phys. Rev. B (1989)
10.1143/JJAP.28.L858 / Jpn. J. Appl. Phys. (1989)
10.1143/JJAP.30.1 / Jpn. J. Appl. Phys. (1991)
10.1143/JJAP.32.1368 / Jpn. J. Appl. Phys. (1993)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 1, 2002, 6:45 p.m.)
Deposited	2 years, 8 months ago (Dec. 7, 2022, 12:30 p.m.)
Indexed	6 months ago (Feb. 21, 2025, 5:34 a.m.)
Issued	30 years, 7 months ago (Jan. 1, 1995)
Published	30 years, 7 months ago (Jan. 1, 1995)
Published Print	30 years, 7 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Doi_1995, title={Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface}, volume={34}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.34.25}, DOI={10.1143/jjap.34.25}, number={1R}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Doi, Takahisa and Ichikawa, Masakazu}, year={1995}, month=jan, pages={25} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        2,
        21
      ]
    ],
    "date-time": "2025-02-21T10:34:02Z",
    "timestamp": 1740134042550,
    "version": "3.37.3"
  },
  "reference-count": 6,
  "publisher": "IOP Publishing",
  "issue": "1R",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1995,
            1,
            1
          ]
        ],
        "date-time": "1995-01-01T00:00:00Z",
        "timestamp": 788918400000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://iopscience.iop.org/page/copyright"
    },
    {
      "start": {
        "date-parts": [
          [
            1995,
            1,
            1
          ]
        ],
        "date-time": "1995-01-01T00:00:00Z",
        "timestamp": 788918400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://iopscience.iop.org/info/page/text-and-data-mining"
    }
  ],
  "content-domain": {
    "domain": [
      "iopscience.iop.org"
    ],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1995,
        1,
        1
      ]
    ]
  },
  "abstract": "<jats:p> \n   The electron charge of Si adsorbates evaporated on a  Si(001)-2\u00d71 surface is studied by tracing their behavior after heating of the substrate. A reflection electron microscope (REM) is used to observe denuded zones which are created at the terrace edge and grow with heating time. It is shown that two effects affect the adsorbates. One is the thermal effect, where the zone width (<jats:italic>x</jats:italic>) is proportional to the square root of heating time (<jats:italic>t</jats:italic>). The other is the electric effect, where <jats:italic>x</jats:italic> is proportional to <jats:italic>t</jats:italic>. At the critical time <jats:italic>t</jats:italic>\n                  <jats:sub>\n                     <jats:italic>c</jats:italic>\n                  </jats:sub>, the electric effect becomes a dominant force and the Si adsorbates migrate independently on the substrate surface. In the region of <jats:italic>t</jats:italic>&gt;<jats:italic>t</jats:italic>\n                  <jats:sub> c</jats:sub>, the adsorbates show the features of surface electromigration caused by the electric field. The adsorbates migrate in the same direction as that of the electric field applied for substrate heating. The results indicate that Si adsorbates are positively charged on the Si(001) surface. \n   </jats:p>",
  "DOI": "10.1143/jjap.34.25",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        10,
        1
      ]
    ],
    "date-time": "2002-10-01T22:45:10Z",
    "timestamp": 1033512310000
  },
  "page": "25",
  "update-policy": "https://doi.org/10.1088/crossmark-policy",
  "source": "Crossref",
  "is-referenced-by-count": 10,
  "title": "Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface",
  "prefix": "10.35848",
  "volume": "34",
  "author": [
    {
      "given": "Takahisa",
      "family": "Doi",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Masakazu",
      "family": "Ichikawa",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "266",
  "reference": [
    {
      "key": "",
      "first-page": "529",
      "volume": "48",
      "year": "1988",
      "journal-title": "JETP Lett."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "L303",
      "DOI": "10.1143/JJAP.28.L303",
      "volume": "28",
      "year": "1989",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "5524",
      "DOI": "10.1103/PhysRevB.39.5524",
      "volume": "39",
      "year": "1989",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "L858",
      "DOI": "10.1143/JJAP.28.L858",
      "volume": "28",
      "year": "1989",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "1",
      "DOI": "10.1143/JJAP.30.1",
      "volume": "30",
      "year": "1991",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "",
      "doi-asserted-by": "publisher",
      "first-page": "1368",
      "DOI": "10.1143/JJAP.32.1368",
      "volume": "32",
      "year": "1993",
      "journal-title": "Jpn. J. Appl. Phys."
    }
  ],
  "container-title": "Japanese Journal of Applied Physics",
  "original-title": [],
  "link": [
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.34.25",
      "content-type": "text/html",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.34.25/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.34.25/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.34.25/pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2022,
        12,
        7
      ]
    ],
    "date-time": "2022-12-07T17:30:39Z",
    "timestamp": 1670434239000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://iopscience.iop.org/article/10.1143/JJAP.34.25"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1995,
        1,
        1
      ]
    ]
  },
  "references-count": 6,
  "journal-issue": {
    "issue": "1R",
    "published-print": {
      "date-parts": [
        [
          1995,
          1,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1143/JJAP.34.25",
  "relation": {},
  "ISSN": [
    "0021-4922",
    "1347-4065"
  ],
  "subject": [],
  "container-title-short": "Jpn. J. Appl. Phys.",
  "published": {
    "date-parts": [
      [
        1995,
        1,
        1
      ]
    ]
  },
  "assertion": [
    {
      "value": "Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface",
      "name": "article_title",
      "label": "Article Title"
    },
    {
      "value": "Japanese Journal of Applied Physics",
      "name": "journal_title",
      "label": "Journal Title"
    },
    {
      "value": "paper",
      "name": "article_type",
      "label": "Article Type"
    },
    {
      "value": "Copyright (c) 1995 The Japan Society of Applied Physics",
      "name": "copyright_information",
      "label": "Copyright Information"
    },
    {
      "value": "1994-09-21",
      "name": "date_received",
      "label": "Date Received",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    },
    {
      "value": "1994-11-19",
      "name": "date_accepted",
      "label": "Date Accepted",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    },
    {
      "name": "date_epub",
      "label": "Online publication date",
      "group": {
        "name": "publication_dates",
        "label": "Publication dates"
      }
    }
  ]
}