Crossref journal-article
IOP Publishing
Japanese Journal of Applied Physics (266)
Abstract

We succeeded in obtaining high-resolution images of a cell surface using a tapping-mode atomic force microscope (tapping-mode AFM) in air. The resulting images resolved many particles of 40-80 nm in radius and distinguished regions where the particles formed clusters from other regions. Such images could not be obtained using a contact-mode atomic force microscope (contact-mode AFM) operated under the same conditions. The result demonstrates the possibility of cell surface research using the tapping-mode AFM with molecular resolution.

Bibliography

Umemura, K., Hideo Arakawa, H. A., & Atsushi Ikai, A. I. (1993). High Resolution Images of Cell Surface Using a Tapping-Mode Atomic Force Microscope. Japanese Journal of Applied Physics, 32(11B), L1711.

Authors 3
  1. Kazuo Umemura (first)
  2. Hideo Arakawa Hideo Arakawa (additional)
  3. Atsushi Ikai Atsushi Ikai (additional)
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Dates
Type When
Created 20 years, 6 months ago (Feb. 22, 2005, 9:31 p.m.)
Deposited 2 years, 8 months ago (Dec. 6, 2022, 7:16 p.m.)
Indexed 2 months, 2 weeks ago (June 16, 2025, 8:08 a.m.)
Issued 31 years, 10 months ago (Nov. 1, 1993)
Published 31 years, 10 months ago (Nov. 1, 1993)
Published Print 31 years, 10 months ago (Nov. 1, 1993)
Funders 0

None

@article{Umemura_1993, title={High Resolution Images of Cell Surface Using a Tapping-Mode Atomic Force Microscope}, volume={32}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.32.l1711}, DOI={10.1143/jjap.32.l1711}, number={11B}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Umemura, Kazuo and Hideo Arakawa, Hideo Arakawa and Atsushi Ikai, Atsushi Ikai}, year={1993}, month=nov, pages={L1711} }