Abstract
Atomic interdiffusion in compositionally modulated amorphous Co-Zr films was investigated by means of in situ X-ray diffraction measurements during successive isothermal annealing. The results were analyzed as free-volume-dependent atomic diffusion and activation-type temperature dependence of both the atomic diffusion coefficient, and the annihilation rates of free volume were confirmed with the activation energy Q D=8.84(±0.41)×104 J/mol and Q A=3.77(±0.96)×104 J/mol, respectively.
References
7
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Dates
Type | When |
---|---|
Created | 20 years, 6 months ago (Feb. 22, 2005, 8:58 p.m.) |
Deposited | 2 years, 8 months ago (Dec. 6, 2022, 6:25 p.m.) |
Indexed | 6 months, 1 week ago (Feb. 21, 2025, 5:34 a.m.) |
Issued | 34 years ago (Aug. 1, 1991) |
Published | 34 years ago (Aug. 1, 1991) |
Published Print | 34 years ago (Aug. 1, 1991) |
@article{Tadashi_Mizoguchi_1991, title={Free-Volume-Dependent Atomic Diffusion in Compositionally Modulated Amorphous Co-Zr Films}, volume={30}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.30.1818}, DOI={10.1143/jjap.30.1818}, number={8R}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Tadashi Mizoguchi, Tadashi Mizoguchi and Masakatsu Murata, Masakatsu Murata}, year={1991}, month=aug, pages={1818} }