Abstract
A new technique for the epitaxial growth of silicon has been developed using plasma chemical vapor deposition. Epitaxial thin films were grown on (100) Si substrates at 250°C from a gas mixture of SiH4, SiH2F2, and H2 by glow discharge decomposition. Reflective high-energy electron diffraction (RHEED) measurements showed that the surface of the epitaxial film obtained was smooth. The epitaxial films have been characterized by high resolution transmission electron microscopy (HRTEM) and secondary ion mass spectroscopy (SIMS).
References
9
Referenced
30
10.1149/1.2128792
/ J. Electrochem. Soc. (1979)10.1149/1.2131515
/ J. Electrochem. Soc. (1980)10.1063/1.335418
/ J. Appl. Phys. (1985)10.1143/JJAP.7.1332
/ Jpn. J. Appl. Phys. (1968)10.1149/1.2411228
/ J. Electrochem. Soc. (1968){'key': ''}
10.1063/1.97626
/ Appl. Phys. Lett. (1986){'year': '1986', 'key': ''}
(1986){'key': '', 'first-page': '767', 'volume': '59 & 60', 'year': '1983', 'journal-title': 'Proceeding of the 10th International Conference on Amorphous and Liquid Semiconductors, J. Non-Cryst. Solids'}
/ Proceeding of the 10th International Conference on Amorphous and Liquid Semiconductors, J. Non-Cryst. Solids (1983)
Dates
Type | When |
---|---|
Created | 19 years, 9 months ago (Nov. 4, 2005, 12:35 a.m.) |
Deposited | 2 years, 8 months ago (Dec. 5, 2022, 1:05 p.m.) |
Indexed | 6 months, 1 week ago (Feb. 21, 2025, 5:35 a.m.) |
Issued | 38 years, 3 months ago (June 1, 1987) |
Published | 38 years, 3 months ago (June 1, 1987) |
Published Print | 38 years, 3 months ago (June 1, 1987) |
@article{Nagamine_1987, title={Epitaxial Growth of Silicon by Plasma Chemical Vapor Deposition at a Very Low Temperature of 250°C}, volume={26}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.26.l951}, DOI={10.1143/jjap.26.l951}, number={6A}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Nagamine, Kunihiro and Yamada, Akira and Konagai, Makoto and Takahashi, Kiyoshi}, year={1987}, month=jun, pages={L951} }