DOI: 10.1143/jjap.26.l41. Effect of Atomic Force on the Surface Corrugation of 2H-NbSe<sub>2</sub>Observed by Scanning Tunneling Microscopy

Effect of Atomic Force on the Surface Corrugation of 2H-NbSe2Observed by Scanning Tunneling Microscopy

10.1143/jjap.26.l41

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

Anomalously large surface corrugation of 2H-NbSe2crystal was observed by scanning tunneling microscopy (STM). Besides mounds representing the Se atoms, hollow sites and Nb-atom sites clearly appeared as dips and saddle points, respectively. The lateral resolution was proved to be better than 0.2 nm. The large corrugation amplitude was attributed to the effect of atomic force between the tip and the sample.

Bibliography

Bando, H., Tokumoto, H., Mizutani, W., Watanabe, K., Okano, M., Ono, M., Murakami, H., Okayama, S., Ono, Y., Wakiyama, S., Sakai, F., Endo, K., & Kajimura, K. (1987). Effect of Atomic Force on the Surface Corrugation of 2H-NbSe2Observed by Scanning Tunneling Microscopy. Japanese Journal of Applied Physics, 26(1A), L41.

Authors 13

Hiroshi Bando (first)
Hiroshi Tokumoto (additional)
Wataru Mizutani (additional)
Kazutoshi Watanabe (additional)
Makoto Okano (additional)
Masatoshi Ono (additional)
Hiroshi Murakami (additional)
Shigeo Okayama (additional)
Yuichi Ono (additional)
Shigeru Wakiyama (additional)
Fumiki Sakai (additional)
Kazuhiro Endo (additional)
Koji Kajimura (additional)

References 17 Referenced 22

{'key': 'crKey-10.1143/JJAP.26.L41-BIB1', 'first-page': '355', 'volume': '30', 'year': '1986', 'journal-title': 'IBM J. Res. & Dev.'} / IBM J. Res. & Dev. (1986)
10.1038/315253a0 / Nature (1985)
10.1063/1.96968 / Appl. Phys. Lett. (1986)
10.1126/science.232.4747.211 / Science (1986)
10.1103/PhysRevLett.55.394 / Phys. Rev. Lett. (1985)
10.1103/PhysRevB.34.994 / Phys. Rev. B (1986)
10.1143/JJAP.25.L621 / Jpn. J. Appl. Phys. (1986)
{'year': '1986', 'key': 'crKey-10.1143/JJAP.26.L41-BIB8'} (1986)
{'year': '1979', 'key': 'crKey-10.1143/JJAP.26.L41-BIB9'} (1979)
{'journal-title': 'Proc. 6th Sensor Symp., 1986 (Inst. of Electrical Engineers of Japan, Tokyo, 1986).', 'key': 'crKey-10.1143/JJAP.26.L41-BIB10'} / Proc. 6th Sensor Symp., 1986 (Inst. of Electrical Engineers of Japan, Tokyo, 1986).
10.1103/PhysRevLett.32.720 / Phys. Rev. Lett. (1974)
10.1088/0022-3719/17/17/016 / J. Phys. C: Solid State Phys. (1984)
10.1209/0295-5075/1/1/005 / Europhys. Lett. (1986)
10.1103/PhysRev.31.2602 / Phys. Rev. (1985)
10.1103/PhysRevLett.57.440 / Phys. Rev. Lett. (1986)
10.1103/PhysRevLett.57.444 / Phys. Rev. Lett. (1986)
10.1147/rd.305.0455 / IBM J. Res. & Dev. (1986)

Dates

Type	When
Created	19 years, 9 months ago (Nov. 4, 2005, 12:34 a.m.)
Deposited	2 years, 3 months ago (May 5, 2023, 4:31 a.m.)
Indexed	6 months, 1 week ago (Feb. 21, 2025, 5:36 a.m.)
Issued	38 years, 7 months ago (Jan. 1, 1987)
Published	38 years, 7 months ago (Jan. 1, 1987)
Published Print	38 years, 7 months ago (Jan. 1, 1987)

Funders 0

None

BibTeX

@article{Bando_1987, title={Effect of Atomic Force on the Surface Corrugation of 2H-NbSe2Observed by Scanning Tunneling Microscopy}, volume={26}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.26.l41}, DOI={10.1143/jjap.26.l41}, number={1A}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Bando, Hiroshi and Tokumoto, Hiroshi and Mizutani, Wataru and Watanabe, Kazutoshi and Okano, Makoto and Ono, Masatoshi and Murakami, Hiroshi and Okayama, Shigeo and Ono, Yuichi and Wakiyama, Shigeru and Sakai, Fumiki and Endo, Kazuhiro and Kajimura, Koji}, year={1987}, month=jan, pages={L41} }

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