Abstract
GaAs MESFET ring oscillators were successfully fabricated on silicon substrate. GaAs epitaxial layers were grown directly by MOCVD on Si(100) substrate. A typical transconductance of 200 mS/mm was observed for the FET of 1.0 µm × 10 µm gate. A minimum propagation delay time of 51 ps/gate at a power dissipation of 1.1 mW/gate was observed for an E/D gate ring oscillator with gate length of 1.0 µm.
References
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Dates
Type | When |
---|---|
Created | 19 years, 9 months ago (Nov. 4, 2005, 12:56 a.m.) |
Deposited | 2 years, 8 months ago (Dec. 5, 2022, 9:44 a.m.) |
Indexed | 6 months ago (Feb. 21, 2025, 5:35 a.m.) |
Issued | 40 years, 8 months ago (Dec. 1, 1984) |
Published | 40 years, 8 months ago (Dec. 1, 1984) |
Published Print | 40 years, 8 months ago (Dec. 1, 1984) |
@article{Nonaka_1984, title={Fabrication of GaAs MESFET Ring Oscillator on MOCVD Grown GaAs/Si(100) Substrate}, volume={23}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.23.l919}, DOI={10.1143/jjap.23.l919}, number={12A}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Nonaka, Toshio and Akiyama, Masahiro and Kawarada, Yoshihiro and Kaminishi, Katsuzo}, year={1984}, month=dec, pages={L919} }