DOI: 10.1143/jjap.23.l806. Direct Observation of Al<sub>x</sub>Ga<sub>1-x</sub>As/GaAs Superlattices by REM

Direct Observation of AlxGa1-xAs/GaAs Superlattices by REM

10.1143/jjap.23.l806

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Abstract

Cleavage surface of Al x Ga1-x As/GaAs superlattices were observed by reflection electron microscopy using a conventional transmission electron microscopy, and cross sections of the superlattices were clearly shown as stripe patterns. Strain fields around the superlattice were revealed in a REM image. The irregularities in superlattice layers caused by roughness of a substrate surface were found to be relaxed in successive layers.

Bibliography

Yamamoto, N., & Muto, S. (1984). Direct Observation of AlxGa1-xAs/GaAs Superlattices by REM. Japanese Journal of Applied Physics, 23(10A), L806.

Authors 2

Naoki Yamamoto (first)
Shunichi Muto (additional)

References 6 Referenced 6

10.1016/0039-6028(80)90675-5 / Surf. Sci. (1980)
10.1016/0039-6028(81)90038-8 / Surf. Sci. (1981)
10.1016/0304-3991(83)90223-1 / Ultramicroscopy (1983)
{'year': '1982', 'key': ''} (1982)
10.1016/0040-6090(83)90547-3 / Thin Solid Films (1983)
10.1016/0304-3991(83)90004-9 / Ultramicroscopy (1983)

Dates

Type	When
Created	19 years, 9 months ago (Nov. 4, 2005, 12:56 a.m.)
Deposited	2 years, 8 months ago (Dec. 5, 2022, 9:35 a.m.)
Indexed	6 months, 1 week ago (Feb. 21, 2025, 5:35 a.m.)
Issued	40 years, 11 months ago (Oct. 1, 1984)
Published	40 years, 11 months ago (Oct. 1, 1984)
Published Print	40 years, 11 months ago (Oct. 1, 1984)

Funders 0

None

BibTeX

@article{Yamamoto_1984, title={Direct Observation of AlxGa1-xAs/GaAs Superlattices by REM}, volume={23}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.23.l806}, DOI={10.1143/jjap.23.l806}, number={10A}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Yamamoto, Naoki and Muto, Shunichi}, year={1984}, month=oct, pages={L806} }

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